Microwave dielectric properties of a new ceramic system (1−x)(Mg0.95Zn0.05)TiO3–xCaTiO3 at microwave frequencies

2008 ◽  
Vol 62 (21-22) ◽  
pp. 3773-3775 ◽  
Author(s):  
Cheng-Liang Huang ◽  
Shih-Sheng Liu
Keyword(s):  
Dielectric Properties ◽  
Microwave Dielectric Properties ◽  
Ceramic System ◽  
Microwave Frequencies ◽  
Microwave Dielectric ◽  
System 1

Dielectric Properties of a New Ceramic System (1-x)(Mg0.95Zn0.05)2TiO4-x(Ca0.8Sr0.2)TiO3 at Microwave Frequencies

2020 ◽  
Vol 830 ◽  
pp. 37-42
Author(s):  
Shih Sheng Liu ◽  
Shiuan Ho Chang ◽  
Yuan Bin Chen
Keyword(s):  
Dielectric Properties ◽  
Microwave Dielectric Properties ◽  
Second Phase ◽  
X Ray Diffraction ◽  
Low Loss ◽  
Microwave Frequencies ◽  
Solid State Route ◽  
Microwave Dielectric ◽  
System 1 ◽  
Quality Factor Q

The microwave dielectric properties and microstructures of the (1-x)(Mg0.95Zn0.05)2TiO4-x (Ca0.8Sr0.2)TiO3 ceramics prepared using the conventional solid-state route were investigated. The structure and microstructure were analyzed by X-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. Ilmenite-structured (Mg0.95Zn0.05)TiO3 was detected as a second phase. The coexistence of the second phase, however, did not degrade the dielectric properties of the specimen because the phases were compatible. At x = 0.07, a dielectric constant (εr) of ~17.86, a quality factor (Q×f) value of ~ Q×f~133,600 Hz (at 10 GHz), and a temperature coefficient of resonant frequency (τf) of ~ –5ppm/°Cwere obtained for 0.93(Mg0.95Zn0.05)2TiO4-0.07(Ca0.8Sr0.2)TiO3 ceramic sintered at 1240°C for 4 hr. The dielectric is proposed as a candidate material for low-loss microwave and millimeter wave applications.

Phase, microstructure, and microwave dielectric properties of a new ceramic system: (1 − x)Mg(Ti0.95Sn0.05)O3–xCaTiO3

2017 ◽  
Vol 43 (16) ◽  
pp. 14156-14160 ◽  
Author(s):  
Javed Iqbal ◽  
Hanxing Liu ◽  
Hua Hao ◽  
Atta Ullah ◽  
Minghe Cao ◽  
...  
Keyword(s):  
Dielectric Properties ◽  
Microwave Dielectric Properties ◽  
Ceramic System ◽  
Microwave Dielectric ◽  
System 1

Effect of bond valence on microwave dielectric properties of (Pb1−xCax)(Mg0.33Ta0.67)O3 ceramics

2001 ◽  
Vol 16 (3) ◽  
pp. 817-821 ◽  
Author(s):  
Heung Soo Park ◽  
Ki Hyun Yoon ◽  
Eung Soo Kim
Keyword(s):  
Dielectric Properties ◽  
Microwave Dielectric Properties ◽  
Bond Valence ◽  
Negative Deviation ◽  
Complex Perovskite ◽  
Microwave Frequencies ◽  
Microwave Dielectric ◽  
Dielectric Polarizability ◽  
A Site ◽  
The Relationship

The relationship between the dielectric properties of the complex perovskite (Pb1−xCax)(Mg0.33Ta0.67)O3 ceramics, where 0.45 ≤ × ≤ 0.60, and the dielectric polarizability, related to bond valences of A-site ions, was investigated at microwave frequencies. As the Ca content (x) increased, the deviation of the observed dielectric polarizabilities, calculated by the Clausius–Mosotti equation from the theoretical values calculated by the additivity rule of dielectric polarizability, decreased from −3% to −0.69%. It was found that this deviation was related to the bond valence of the A-site. Smaller negative deviation corresponded to the cations with lower bond valence, and larger negative deviation corresponded to the cations with higher bond valence. Also, the temperature coefficient of resonant frequency (TCF) was affected by the bond valence of the A-site, and then TCF decreased with decreasing bond valence of the A-site in ABO3 perovskite compounds.

Microwave dielectric properties of Ba4LaTi0.3Sn0.7Nb3O15 ceramic

2014 ◽  
Vol 28 (15) ◽  
pp. 1450092 ◽  
Author(s):  
Abdul Manan ◽  
Imtiaz Hussain
Keyword(s):  
Dielectric Properties ◽  
Single Phase ◽  
Least Squares Method ◽  
Microwave Dielectric Properties ◽  
Network Analyzer ◽  
X Ray Diffraction ◽  
Microstructural Investigation ◽  
Microwave Frequencies ◽  
Microwave Dielectric ◽  
Lcr Meter

Ba 4 LaTi 0.3 Sn 0.7 O 15 ceramic was prepared through conventional solid state mix oxide route followed by characterization using X-ray diffraction (XRD) and scanning electron microscope (SEM) for phase and microstructural investigation. The dielectric properties at low and microwave frequencies were measured using LCR meter and vector network analyzer. XRD results revealed single phase ceramics and the microstructure was comprised of compact grains with size ranging from 4–12 μm. The lattice parameters refined by the least squares method were a = b = 5.7680(2) Å, c = 11.7491(6) Å, V = 337.81 Å3 and Z = 1. Optimum properties i.e., εr~44.6, Qufo~15, 500 GHz and τf~2.05 ppm /° C were achieved for Ba 4 LaTi 0.3 Sn 0.7 Nb 3 O 15 ceramic sintered at 1475°C for 4 h.

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