Low temperature grown highly texture aluminum alloyed iron silicide on silicon substrate for opto-electronic applications

2015 ◽  
Vol 159 ◽  
pp. 455-458 ◽  
Author(s):  
Goutam Kumar Dalapati ◽  
Cheng Cheh Tan ◽  
Saeid Masudy-Panah ◽  
Hui Ru Tan ◽  
Dongzhi Chi
2021 ◽  
Vol 118 (17) ◽  
pp. e2021203118
Author(s):  
Biao Yang ◽  
Martin Uphoff ◽  
Yi-Qi Zhang ◽  
Joachim Reichert ◽  
Ari Paavo Seitsonen ◽  
...  

Iron silicide (FeSi) is a fascinating material that has attracted extensive research efforts for decades, notably revealing unusual temperature-dependent electronic and magnetic characteristics, as well as a close resemblance to the Kondo insulators whereby a coherent picture of intrinsic properties and underlying physics remains to be fully developed. For a better understanding of this narrow-gap semiconductor, we prepared and examined FeSi(110) single-crystal surfaces of high quality. Combined insights from low-temperature scanning tunneling microscopy and density functional theory calculations (DFT) indicate an unreconstructed surface termination presenting rows of Fe–Si pairs. Using high-resolution tunneling spectroscopy (STS), we identify a distinct asymmetric electronic gap in the sub-10 K regime on defect-free terraces. Moreover, the STS data reveal a residual density of states in the gap regime whereby two in-gap states are recognized. The principal origin of these features is rationalized with the help of the DFT-calculated band structure. The computational modeling of a (110)-oriented slab notably evidences the existence of interfacial intragap bands accounting for a markedly increased density of states around the Fermi level. These findings support and provide further insight into the emergence of surface metallicity in the low-temperature regime.


2018 ◽  
Vol 11 (01) ◽  
pp. 1850011
Author(s):  
Lipeng Ren ◽  
Wei Wang ◽  
Chenglei Yu ◽  
Saisai Duan ◽  
Wenjing Ma ◽  
...  

In this work, Ni films with the thickness of 50[Formula: see text]nm were deposited on (110) silicon substrate by electron beam evaporation at the temperature of 125[Formula: see text]C, 300[Formula: see text]C and 500[Formula: see text]C. Graphene was prepared on Ni films by PECVD to study the effect of Ni film structure and surface morphology on the graphene grown by PECVD. The result shows that the particle size and surface roughness of Ni film increase, as the temperature of substrate go up. The Ni film deposited at 125[Formula: see text]C exhibits amorphous state, and the Ni films deposited at 300[Formula: see text]C and 500[Formula: see text]C exhibit (111) microcrystal structure. The graphene grown on the microcrystalline Ni film deposited at 300[Formula: see text]C is the bilayer structure with less defects and uniform morphology. The graphene prepared on the microcrystalline Ni film deposited at 500[Formula: see text]C has more defects, layers and obvious plane undulation. The analysis indicates that microcrystalline Ni film deposited at 300[Formula: see text]C can be used by PECVD at low temperature to prepare a bilayer graphene with less defects and uniform morphology.


China Foundry ◽  
2016 ◽  
Vol 13 (1) ◽  
pp. 42-46
Author(s):  
Ke Jiang ◽  
Ying-dong Qu ◽  
Jun-hua You ◽  
Rong-de Li ◽  
Qing-chun Xiang ◽  
...  

2011 ◽  
Vol 21 (11) ◽  
pp. 3646 ◽  
Author(s):  
Shu Chen ◽  
Donald A. MacLaren ◽  
Richard T. Baker ◽  
John N. Chapman ◽  
Stephen Lee ◽  
...  

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Goutam Kumar Dalapati ◽  
Saeid Masudy-Panah ◽  
Avishek Kumar ◽  
Cheng Cheh Tan ◽  
Hui Ru Tan ◽  
...  

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