Enhancing the surface sensitivity of in-situ/operando characterization of palladium membranes through polarization modulation and synthesis of optically smooth palladium thin films

2021 ◽  
pp. 119605
Author(s):  
Garam Lee ◽  
Justin Easa ◽  
Renxi Jin ◽  
Austin Booth ◽  
Casey P. O'Brien
Keyword(s):  
Thin Films ◽  
Polarization Modulation ◽  
Surface Sensitivity ◽  
Palladium Membranes

scholarly journals In Situ Lorentz Differential Phase Contrast STEM Characterization of Rashba Interaction on Skyrmion Thin Films

2018 ◽  
Vol 24 (S1) ◽  
pp. 1900-1901
Author(s):  
B. D. Esser ◽  
A. S. Ahmed ◽  
K. Meng ◽  
J. Rowland ◽  
M. Randeria ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Contrast ◽  
Differential Phase ◽  
Rashba Interaction ◽  
Differential Phase Contrast

In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O2 atmosphere

2012 ◽  
Vol 544 ◽  
pp. 34-38 ◽  
Author(s):  
T. Hosokai ◽  
A. Hinderhofer ◽  
A. Vorobiev ◽  
C. Lorch ◽  
T. Watanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

FT-IR, SIMS and electrical characterization of Si3N4 thin films obtained from CVD, assisted by in situ electrical discharge

1993 ◽  
Vol 24 (4) ◽  
pp. 389-393
Author(s):  
B. Balland ◽  
R. Botton ◽  
M. Lemiti ◽  
J.C. Bureau ◽  
A. Glachant
Keyword(s):  
Thin Films ◽  
Electrical Discharge ◽  
Electrical Characterization ◽  
Ft Ir

scholarly journals High-temperature (1500 K) reciprocal space mapping on a laboratory X-ray diffractometer

2007 ◽  
Vol 40 (2) ◽  
pp. 332-337 ◽  
Author(s):  
R. Guinebretière ◽  
A. Boulle ◽  
R. Bachelet ◽  
O. Masson ◽  
P. Thomas
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Reciprocal Space ◽  
Primary Beam ◽  
Sample Holder ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
Translation Stage

A laboratory X-ray diffractometer devoted to thein situcharacterization of the microstructure of epitaxic thin films at temperatures up to 1500 K has been developed. The sample holder was built using refractory materials, and a high-accuracy translation stage allows correction of the dilatation of both the sample and the sample holder. The samples are oriented with respect to the primary beam with two orthogonal rotations allowing the registration of symmetric as well as asymmetric reciprocal space maps (RSMs). The association of a monochromatic primary beam and a position-sensitive detector allows the measurement of RSMs in a few minutes for single crystals and in a few hours for imperfect epitaxic thin films. A detailed description of the setup is given and its potential is illustrated by high-temperature RSM experiments performed on yttria-doped zirconia epitaxic thin films grown on sapphire substrates.

In situ characterization of sputtered thin films using a normal incidence laser reflectometer

1992 ◽  
Vol 10 (4) ◽  
pp. 939-944 ◽  
Author(s):  
Dubravko I. Babić ◽  
Thomas E. Reynolds ◽  
Evelyn L. Hu ◽  
John E. Bowers
Keyword(s):  
Thin Films ◽  
Normal Incidence ◽  
In Situ Characterization
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