scholarly journals Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements

2007 ◽  
Vol 47 (9-11) ◽  
pp. 1456-1461 ◽  
Author(s):  
Y. Gao ◽  
N. Guitard ◽  
C. Salamero ◽  
M. Bafleur ◽  
L. Bary ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Latent Defects ◽  
Noise Measurements

scholarly journals LOW-FREQUENCY NOISE MEASUREMENTS OF IR PHOTODETECTORS WITH VOLTAGE CROSS CORRELATION SYSTEM

Measurement ◽  
2021 ◽  
pp. 109867
Author(s):  
Krzysztof ACHTENBERG ◽  
Janusz MIKOŁAJCZYK ◽  
Carmine CIOFI ◽  
Graziella SCANDURRA ◽  
Krystian MICHALCZEWSKI ◽  
...  
Keyword(s):  
Cross Correlation ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Ir Photodetectors ◽  
Noise Measurements ◽  
Correlation System

Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN

2003 ◽  
Vol 433-436 ◽  
pp. 677-680 ◽  
Author(s):  
Nobuhisa Tanuma ◽  
Hirokazu Tanizaki ◽  
Saburo Yokokura ◽  
T. Matsui ◽  
Sumihisa Hashiguchi ◽  
...  
Keyword(s):  
Quality Indicator ◽  
Ohmic Contacts ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Measurements
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