Three-step concept (TSC) in modeling microelectronics reliability (MR): Boltzmann–Arrhenius–Zhurkov (BAZ) probabilistic physics-of-failure equation sandwiched between two statistical models
2014 ◽
Vol 54
(11)
◽
pp. 2594-2603
◽
1997 ◽
Vol 21
(1-2)
◽
pp. S505-S510
◽
Keyword(s):
Keyword(s):
2009 ◽
Vol 35
(2)
◽
pp. 341-347
◽