Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests
2018 ◽
Vol 88-90
◽
pp. 219-224
◽
2016 ◽
Vol 64
◽
pp. 415-418
◽
2015 ◽
Vol 55
(9-10)
◽
pp. 1391-1394
◽
2013 ◽
Vol 325-326
◽
pp. 486-489
◽
2014 ◽
Vol 3
(6)
◽
pp. 425-429
2018 ◽
Vol 88-90
◽
pp. 645-651
◽
2021 ◽
Vol 10
(8)
◽
pp. 120-126