Contactless device characterization of transistor structures in silicon using electro optical frequency mapping (EOFM)

Microelectronics Reliability ◽

10.1016/j.microrel.2020.113583 ◽

2020 ◽

Vol 106 ◽

pp. 113583

Author(s):

A. Beyreuther ◽

N. Herfurth ◽

T. Nakamura ◽

G.G. Fischer ◽

S. Keil ◽

...

Keyword(s):

Optical Frequency ◽

Device Characterization

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Multiheterodyne detection for self-referenced characterization of complex arbitrary waveforms from largely detuned optical frequency combs

IEEE Avionics, Fiber-Optics and Photonics Digest CD ◽

10.1109/avfop.2012.6344043 ◽

2012 ◽

Author(s):

Anthony C. Klee ◽

Josue Davila-Rodriguez ◽

Marcus Bagnell ◽

Peter J. Delfyett

Keyword(s):

Optical Frequency ◽

Optical Frequency Combs ◽

Frequency Combs

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Distributed Characterization of Few-Mode Fibers Based on Optical Frequency Domain Reflectometry

2018 European Conference on Optical Communication (ECOC) ◽

10.1109/ecoc.2018.8535359 ◽

2018 ◽

Author(s):

Riccardo Veronese ◽

Andrea Galtarossa ◽

Luca Palmieri

Keyword(s):

Frequency Domain ◽

Optical Frequency ◽

Optical Frequency Domain Reflectometry ◽

Frequency Domain Reflectometry

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Integrated optical frequency domain reflectometry device for characterization of complex integrated devices

Optics Express ◽

10.1364/oe.26.030000 ◽

2018 ◽

Vol 26 (23) ◽

pp. 30000 ◽

Author(s):

Luis A. Bru ◽

Daniel Pastor ◽

Pascual Muñoz

Keyword(s):

Frequency Domain ◽

Optical Frequency ◽

Integrated Devices ◽

Optical Frequency Domain Reflectometry ◽

Integrated Optical ◽

Frequency Domain Reflectometry

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Fast Amplitude and Phase Characterization of Optical Frequency Combs Propagating over 50 km of Optical Fiber using Dual Quadrature Spectral Interferometry

Optical Fiber Communication Conference and National Fiber Optic Engineers Conference ◽

10.1364/ofc.2009.othd2 ◽

2009 ◽

Author(s):

V. R. Supradeepa ◽

D. E. Leaird ◽

A. M. Weiner

Keyword(s):

Optical Fiber ◽

Optical Frequency ◽

Optical Frequency Combs ◽

Frequency Combs ◽

Spectral Interferometry ◽

Phase Characterization

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Device Characterization of Thin-Film Phototransistors for Photosensor Applications

IEICE Transactions on Electronics ◽

10.1093/ietele/e91-c.10.1557 ◽

2008 ◽

Vol E91-C (10) ◽

pp. 1557-1563 ◽

Author(s):

M. KIMURA ◽

Y. NISHIZAKI ◽

T. YAMASHITA ◽

T. SHIMA ◽

T. HACHIDA

Keyword(s):

Thin Film ◽

Device Characterization

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Characterization of Distributed Bragg Reflectors using Optical Frequency Domain Reflectometry

2018 IEEE Photonics Conference (IPC) ◽

10.1109/ipcon.2018.8527316 ◽

2018 ◽

Author(s):

Dan Zhao ◽

Dzmitry Pustakhod ◽

Kevin Williams ◽

Xaveer Leijtens

Keyword(s):

Frequency Domain ◽

Optical Frequency ◽

Bragg Reflectors ◽

Distributed Bragg Reflectors ◽

Optical Frequency Domain Reflectometry ◽

Frequency Domain Reflectometry

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Fabrication and Device Characterization of Omega-Shaped-Gate ZnO Nanowire Field-Effect Transistors

Nano Letters ◽

10.1021/nl060708x ◽

2006 ◽

Vol 6 (7) ◽

pp. 1454-1458 ◽

Author(s):

Kihyun Keem ◽

Dong-Young Jeong ◽

Sangsig Kim ◽

Moon-Sook Lee ◽

In-Seok Yeo ◽

...

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Zno Nanowire ◽

Device Characterization

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Characterization of a 88Sr+ optical frequency standard at 445 THz by two-trap comparison

2012 Conference on Precision electromagnetic Measurements ◽

10.1109/cpem.2012.6250906 ◽

2012 ◽

Author(s):

GP Barwood ◽

P Gill ◽

G Huang ◽

HA Klein

Keyword(s):

Frequency Standard ◽

Optical Frequency ◽

Optical Frequency Standard

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Fabrication and Device Characterization of Buried Ridge II-VI Blue-Green Laser Diodes

10.7567/ssdm.1997.c-6-1 ◽

1997 ◽

Author(s):

P. F. Baude ◽

F. R. Chien ◽

G. M. Haugen ◽

D. C. Grillo ◽

T. J. Miller ◽

...

Keyword(s):

Laser Diodes ◽

Green Laser ◽

Device Characterization

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Spatial characterization of strong FBGs using thermal linear chirp and optical frequency domain reflectometry

Bragg Gratings, Photosensitivity, and Poling in Glass Waveguides ◽

10.1364/bgpp.2003.wc2 ◽

2003 ◽

Author(s):

Ole Henrik Waagaard ◽

Jon Thomas Kringlebotn ◽

Erik Magnus Bruvik

Keyword(s):

Frequency Domain ◽

Optical Frequency ◽

Spatial Characterization ◽

Optical Frequency Domain Reflectometry ◽

Linear Chirp ◽

Frequency Domain Reflectometry

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