Fabrication and Device Characterization of Omega-Shaped-Gate ZnO Nanowire Field-Effect Transistors

Nano Letters ◽  
2006 ◽  
Vol 6 (7) ◽  
pp. 1454-1458 ◽  
Author(s):  
Kihyun Keem ◽  
Dong-Young Jeong ◽  
Sangsig Kim ◽  
Moon-Sook Lee ◽  
In-Seok Yeo ◽  
...  
2009 ◽  
Vol 18 (11) ◽  
pp. 5020-5023 ◽  
Author(s):  
Li Ming ◽  
Zhang Hai-Ying ◽  
Guo Chang-Xin ◽  
Xu Jing-Bo ◽  
Fu Xiao-Jun ◽  
...  

2010 ◽  
Vol 654-656 ◽  
pp. 1178-1181
Author(s):  
Hui Feng Li ◽  
Yun Hua Huang ◽  
Xiu Jun Xing ◽  
Jia Su ◽  
Yue Zhang

The electrical properties of single ZnO nanowire were researched in the chamber of a scanning electron microscope under high-vacuum conditions using nanomanipulator and measurement system. The result shows that ZnO nanowire resistivity was about 1.4 Ω•cm with Ohmic contact. The local change of electron density induced by Shottky contacts or Ohmic contact with tip and semiconductor/metal materials significantly affects the current transport through the nanowire. Single ZnO nanowire was configured as field effect transistors (FET) and based on metal tantalum (Ta) as electrodes show a pronounced n-type gate modulation with an electron concentration of ~1.0×1019 cm−3 and an electron mobility of ~52 cm2 /V s at a bias voltage of 1 V.


2007 ◽  
Vol 7 (11) ◽  
pp. 4101-4105
Author(s):  
Ahnsook Yoon ◽  
Woong-Ki Hong ◽  
Takhee Lee

We report the fabrication and electrical characterization of ZnO nanowire field effect transistors (FETs). Dielectrophoresis technique was used to directly align ZnO nanowires between lithographically prepatterned source and drain electrodes, and spin-coated polyvinylphenol (PVP) polymer thin layer was used as a gate dielectric layer in "top-gate" FET device configuration. The electrical characteristics of the top-gate ZnO nanowire FETs were found to be comparable to the conventional "bottom-gate" nanowire FETs with a SiO2 gate dielectric layer, suggesting the directly-assembled nanowire FET with a polymer gate dielectric layer is a useful device structure of nanowire FETs.


2012 ◽  
Vol 51 ◽  
pp. 035001 ◽  
Author(s):  
Taehyeon Kwon ◽  
Woojin Park ◽  
Minhyeok Choe ◽  
Jongwon Yoon ◽  
Sangsu Park ◽  
...  

2007 ◽  
Vol 7 (11) ◽  
pp. 4101-4105 ◽  
Author(s):  
Ahnsook Yoon ◽  
Woong-Ki Hong ◽  
Takhee Lee

We report the fabrication and electrical characterization of ZnO nanowire field effect transistors (FETs). Dielectrophoresis technique was used to directly align ZnO nanowires between lithographically prepatterned source and drain electrodes, and spin-coated polyvinylphenol (PVP) polymer thin layer was used as a gate dielectric layer in "top-gate" FET device configuration. The electrical characteristics of the top-gate ZnO nanowire FETs were found to be comparable to the conventional "bottom-gate" nanowire FETs with a SiO2 gate dielectric layer, suggesting the directly-assembled nanowire FET with a polymer gate dielectric layer is a useful device structure of nanowire FETs.


2012 ◽  
Vol 51 (3R) ◽  
pp. 035001
Author(s):  
Taehyeon Kwon ◽  
Woojin Park ◽  
Choe ◽  
Jongwon Yoon ◽  
Sangsu Park ◽  
...  

2021 ◽  
pp. 108079
Author(s):  
Dong-Hyeok Son ◽  
Terirama Thingujam ◽  
Quan Dai ◽  
Jeong-Gil Kim ◽  
Sorin Cristoloveanu ◽  
...  

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