A high-efficiency threshold voltage distribution test method based on the reliability of 3D NAND flash memory

2020 ◽  
Vol 114 ◽  
pp. 113897
Author(s):  
Debao Wei ◽  
Xiaoyu Chen ◽  
Hua Feng ◽  
Liyan Qiao ◽  
Xiyuan Peng
Keyword(s):  
Threshold Voltage ◽  
Flash Memory ◽  
High Efficiency ◽  
Test Method ◽  
Nand Flash ◽  
Voltage Distribution ◽  
Nand Flash Memory ◽  
Threshold Voltage Distribution

Modeling of Threshold Voltage Distribution in 3D NAND Flash Memory

2021 ◽  
Author(s):  
Weihua Liu ◽  
Fei Wu ◽  
Jian Zhou ◽  
Meng Zhang ◽  
Chengmo Yang ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Flash Memory ◽  
Nand Flash ◽  
Voltage Distribution ◽  
Nand Flash Memory ◽  
Threshold Voltage Distribution
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