Surface chemistry of oxidised pyrite during grinding: ToF-SIMS and XPS surface analysis

2021 ◽  
Vol 170 ◽  
pp. 106992
Author(s):  
Shihong Xu ◽  
Massimiliano Zanin ◽  
William Skinner ◽  
Susana Brito e Abreu
2018 ◽  
Vol 165 (5) ◽  
pp. A819-A832 ◽  
Author(s):  
Natalia Schulz ◽  
René Hausbrand ◽  
Lucangelo Dimesso ◽  
Wolfram Jaegermann

2006 ◽  
Vol 70 (18) ◽  
pp. A597 ◽  
Author(s):  
Roger St. C. Smart ◽  
Brian Hart ◽  
Mark Biesinger ◽  
James Francis ◽  
Tesfaye Negeri

BioResources ◽  
2016 ◽  
Vol 11 (2) ◽  
pp. 5581-5599
Author(s):  
Hong Yan Mou ◽  
Shubin Wu ◽  
Pedro Fardim

Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an advanced surface-sensitive technique that can provide both spectral and imaging information about materials. Recently, ToF-SIMS has been used for advanced studies of lignocellulosic biomass. In the current article, the application of ToF-SIMS to the characterization of the surface chemical composition and distribution of biomass components in lignocelluloses is reviewed. Moreover, extended applications of ToF-SIMS in the study of pretreatments, modification of biomaterials, and enzyme activity of lignocellulosic materials are presented and discussed. Sample preparation prior to ToF-SIMS analysis and subsequent interpretation of results is a critical factor in ensuring reliable results. The focus of this review is to give a comprehensive understanding of and offer new hints about the effects of processing conditions on the surface chemistry of lignocellulosic biomass.


1999 ◽  
Vol 14 (3) ◽  
pp. 429-434 ◽  
Author(s):  
Geert Verlinden ◽  
Renaat Gijbels ◽  
Ingrid Geuens ◽  
Rene De Keyzer

1989 ◽  
pp. 1983-1989 ◽  
Author(s):  
Hidetaka MORISHIGE ◽  
Jun TAMAKI ◽  
Yasutake TERAOKA ◽  
Norio MIURA ◽  
Noboru YAMAZOE

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