Angular and lateral distributions from small angle multiple scattering including elastic and inelastic energy loss effects based on the Valdes and Arista model

2013 ◽  
Vol 316 ◽  
pp. 222-231
Author(s):  
Seiji Ikegami
Keyword(s):  
Energy Loss ◽  
Multiple Scattering ◽  
Small Angle ◽  
Inelastic Energy Loss

scholarly journals Inelastic energy loss of Ar ions scattered Al2O3 surface under grazing incidence

2021 ◽  
Vol 22 (2) ◽  
pp. 255-259
Author(s):  
A.S. Ashirov ◽  
M.K. Qurbanov ◽  
I.U. Tangribergenov ◽  
M.K. Karimov ◽  
K.U. Otabaeva
Keyword(s):  
Energy Loss ◽  
Small Angle ◽  
Grazing Incidence ◽  
Binary Collision ◽  
Geometrical Parameters ◽  
Angle Of Incidence ◽  
Ion Scattering ◽  
Inelastic Energy Loss ◽  
Ion Scattering Spectroscopy ◽  
Collision Approximation

In this paper presents the investigation of the surface Al2O3  by ion  scattering spectroscopy. The trajectory of small angle scattered ions calculated by the method of binary collision approximation.  It was found dependence of inelastic energy loss and trajectories of scattered ions. The value of inelastic energy loss scattered ions almost depend to the angle of incidence and the geometrical parameters of surface semichannels.

Background Fitting in the Low-Loss Region of Electron Energy Loss Spectra

1990 ◽  
Vol 48 (2) ◽  
pp. 56-57
Author(s):  
C P Scott ◽  
A J Craven ◽  
C J Gilmore ◽  
A W Bowen
Keyword(s):  
Energy Loss ◽  
Multiple Scattering ◽  
Simple Form ◽  
Single Scattering ◽  
Low Loss ◽  
Characteristic Energy ◽  
Normal Method ◽  
Fitting In ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

The normal method of background subtraction in quantitative EELS analysis involves fitting an expression of the form I=AE-r to an energy window preceding the edge of interest; E is energy loss, A and r are fitting parameters. The calculated fit is then extrapolated under the edge, allowing the required signal to be extracted. In the case where the characteristic energy loss is small (E < 100eV), the background does not approximate to this simple form. One cause of this is multiple scattering. Even if the effects of multiple scattering are removed by deconvolution, it is not clear that the background from the recovered single scattering distribution follows this simple form, and, in any case, deconvolution can introduce artefacts.The above difficulties are particularly severe in the case of Al-Li alloys, where the Li K edge at ~52eV overlaps the Al L2,3 edge at ~72eV, and sharp plasmon peaks occur at intervals of ~15eV in the low loss region. An alternative background fitting technique, based on the work of Zanchi et al, has been tested on spectra taken from pure Al films, with a view to extending the analysis to Al-Li alloys.

Characterization of alumina powder using multiple small-angle neutron scattering. I. Theory

1985 ◽  
Vol 18 (6) ◽  
pp. 467-472 ◽  
Author(s):  
N. F. Berk ◽  
K. A. Hardman-Rhyne
Keyword(s):  
Particle Size ◽  
Phase Shift ◽  
Neutron Scattering ◽  
Multiple Scattering ◽  
Small Angle ◽  
Small Angle Neutron Scattering ◽  
Volume Fraction ◽  
Scattering Data ◽  
Alumina Powder ◽  
Beam Broadening

Microstructural parameters of high-purity alumina powder are determined quantitatively throughout the bulk of the material using small-angle neutron scattering techniques. A unified theoretical and experimental approach for analyzing multiple scattering data is developed to obtain values for particle size, volume fraction and surface area. It is shown how particle size and volume fraction can be measured in a practical way from SANS data totally dominated by incoherent multiple scattering (`beam broadening'). The general phase-shift dependence of single-particle scattering is incorporated into the multiple scattering formalism, and it is also shown that the diffractive limit (small phase shift) applies even for phase shifts as large as unity (particle radii of order 1 μm). The stability of the Porod law against multiple scattering and the phase-shift scale are described, a useful empirical formula for analysis of beam broadening data is exhibited, and the applicability of the formulations to polydispersed systems is discussed.

Backscattered pulse shape due to small-angle multiple scattering in random media

Radio Science ◽  
1980 ◽  
Vol 15 (1) ◽  
pp. 87-93 ◽  
Author(s):  
Akira Ishimaru ◽  
Kirk J. Painter
Keyword(s):  
Multiple Scattering ◽  
Small Angle ◽  
Pulse Shape ◽  
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