A comparative study of multiple scattering calculations implemented in general–purpose Monte Carlo and selected ion beam analysis codes

2021 ◽  
Vol 496 ◽  
pp. 71-77
Author(s):  
E.G. Androulakaki ◽  
M. Kokkoris ◽  
M. Mayer ◽  
E. Mitsi ◽  
N. Patronis ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Comparative Study ◽  
Multiple Scattering ◽  
Ion Beam ◽  
General Purpose ◽  
Ion Beam Analysis ◽  
Beam Analysis

scholarly journals Aluminium incorporation in AlxGa1−xN/GaN heterostructures: A comparative study by ion beam analysis and X-ray diffraction

2008 ◽  
Vol 516 (23) ◽  
pp. 8447-8452 ◽  
Author(s):  
A. Redondo-Cubero ◽  
R. Gago ◽  
F. González-Posada ◽  
U. Kreissig ◽  
M.-A. di Forte Poisson ◽  
...  
Keyword(s):  
Comparative Study ◽  
Ion Beam ◽  
X Ray Diffraction ◽  
Ion Beam Analysis ◽  
X Ray ◽  
Beam Analysis

Ion Beam Analysis and PD-MS As New Analytical Tools for Quality Control of Pharmaceuticals: Comparative Study from Fluphenazine in Solid Dosage Forms

2010 ◽  
Vol 82 (17) ◽  
pp. 7309-7318 ◽  
Author(s):  
Bilal Nsouli ◽  
Alice Bejjani ◽  
Serge Della Negra ◽  
Alain Gardon ◽  
Jean-Paul Thomas
Keyword(s):  
Quality Control ◽  
Comparative Study ◽  
Ion Beam ◽  
Dosage Forms ◽  
Solid Dosage Forms ◽  
Ion Beam Analysis ◽  
Solid Dosage ◽  
Beam Analysis ◽  
Analytical Tools

scholarly journals Evaluation of the sub-surface morphology and composition of gunshot residue using focussed ion beam analysis

2019 ◽  
Vol 297 ◽  
pp. 100-110 ◽  
Author(s):  
Nick Lucas ◽  
Kelsey E. Seyfang ◽  
Andrew Plummer ◽  
Michael Cook ◽  
K. Paul Kirkbride ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Ion Beam ◽  
Gunshot Residue ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Focussed Ion Beam

scholarly journals A New High-Throughput Focused MeV Ion-Beam Analysis Setup

Instruments ◽  
2021 ◽  
Vol 5 (1) ◽  
pp. 10
Author(s):  
Sören Möller ◽  
Daniel Höschen ◽  
Sina Kurth ◽  
Gerwin Esser ◽  
Albert Hiller ◽  
...  
Keyword(s):  
Gamma Ray ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Complete Analysis ◽  
Nuclear Reaction Analysis ◽  
Beam Optics ◽  
Single Measurement ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Technical Solutions

The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NRA), and Rutherford-backscattering-spectrometry (RBS) provides the most complete analysis over the whole periodic table in a single measurement. Yet, for a highly resolved and accurate IBA analysis, a sophisticated technical setup is required integrating the detectors, beam optics, and sample arrangement. A new end-station developed and installed in Forschungszentrum Jülich provides these capabilities in combination with high sample throughput and result accuracy. Mechanical tolerances limit the device accuracy to 3% for RBS. Continuous pumping enables 5*10−8 mbar base pressure with vibration amplitudes < 0.1 µm. The beam optics achieves a demagnification of 24–34, suitable for µ-beam analysis. An in-vacuum manipulator enables scanning 50 × 50 mm² sample areas with 10 nm accuracy. The setup features the above-mentioned IBA detectors, enabling a broad range of analysis applications such as the operando analysis of batteries or the post-mortem analysis of plasma-exposed samples with up to 3000 discrete points per day. Custom apertures and energy resolutions down to 11 keV enable separation of Fe and Cr in RBS. This work presents the technical solutions together with the quantification of these challenges and their success in the form of a technical reference.

Characterization of GaAs[sub 1−x]N[sub x] epitaxial layers by ion beam analysis

2004 ◽  
Vol 22 (3) ◽  
pp. 908 ◽  
Author(s):  
P. Wei ◽  
M. Chicoine ◽  
S. Gujrathi ◽  
F. Schiettekatte ◽  
J.-N. Beaudry ◽  
...  
Keyword(s):  
Ion Beam ◽  
Epitaxial Layers ◽  
Ion Beam Analysis ◽  
Beam Analysis

scholarly journals Diffusion and Distribution Studies of Photoacid Generators. Ion Beam Analysis in Lithograpy.

1999 ◽  
Vol 12 (3) ◽  
pp. 457-467 ◽  
Author(s):  
Narayan Sundararajan ◽  
Christopher F. Keimel ◽  
Navin Bhargava ◽  
Christopher K. Ober ◽  
Juliann Opitz ◽  
...  
Keyword(s):  
Ion Beam ◽  
Ion Beam Analysis ◽  
Photoacid Generators ◽  
Beam Analysis ◽  
Distribution Studies
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