scholarly journals Preparation and Characterization of Thin Conductive Polymer Films on the base of PEDOT:PSS by Ink-Jet Printing

2013 ◽  
Vol 44 ◽  
pp. 120-129 ◽  
Author(s):  
Nikola Perinka ◽  
Chang Hyun Kim ◽  
Marie Kaplanova ◽  
Yvan Bonnassieux
2013 ◽  
Vol 37 (3) ◽  
pp. 873-883 ◽  
Author(s):  
Tsai-Cheng Li ◽  
Rwei-Ching Chang ◽  
Yen-Choung Li

Silver conductive thin films deposited on glass and polyimide substrates by using ink jet printing are studied in this work. Characterization of the printed thin films and comparison with sputtered films are investigated. The micro texture, residual stress, adhesion, hardness, optical reflectance, and electric resistance of the thin films are discussed. The result shows that the ink jet printing has the possibility to replace sputtering in thin film deposition, especially for the polymer substrates.


2014 ◽  
Vol 24 (2) ◽  
pp. 73-80 ◽  
Author(s):  
Ki-Chan Lee ◽  
Jong-Won Yoon ◽  
Jin-Ho Kim ◽  
Kwang-Taek Hwang ◽  
Kyu-Sung Han

2017 ◽  
Vol 43 (3) ◽  
pp. 246-256 ◽  
Author(s):  
Xiaojin Peng ◽  
Qi Zhang ◽  
Jinshu Cheng ◽  
Jian Yuan ◽  
Ya Wu ◽  
...  

MRS Advances ◽  
2018 ◽  
Vol 3 (49) ◽  
pp. 2953-2958
Author(s):  
Joshua Mayersky ◽  
Rashmi Jha

ABSTRACTIn this work, a printable tungsten disulfide (WS2) based ink is developed from readily available WS2 powder (0.6 µm average particle size), and an ink-jet printing based deposition method for a tungsten disulfide film is presented. WS2 flake coverage and bulk electrical characteristics under three different irradiance conditions are examined and discussed. Presence of excitons in the absorbance of the inks is performed by optical UV-Vis spectrometry. Metrics using the A exciton peak generated by the few-layered flakes are used to calculate the average flake lateral dimensions, the concentration of WS2 in the inks after size selection and filtering, as well as the average monolayer count of the flakes. After printing, scanning electron microscopy is used to confirm average flake lateral size and average flake area coverage, while an atomic force microscope is used to confirm flake thickness.


2014 ◽  
Vol 12 (11) ◽  
pp. 1620-1627 ◽  
Author(s):  
Nikola Peřinka ◽  
Markéta Držková ◽  
Danijela V. Randjelović ◽  
Paolo Bondavalli ◽  
Milena Hajná ◽  
...  

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