Geometry effects and frequency dependence in scanning capacitance microscopy on GaAs Schottky and metal–oxide–semiconductor-Type junctions
2010 ◽
Vol 42
(4)
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pp. 1196-1199
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2002 ◽
Vol 41
(Part 1, No. 2A)
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pp. 458-463
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1995 ◽
Vol 26
(6)
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pp. 95-106
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Keyword(s):
Keyword(s):
2000 ◽
Vol 18
(4)
◽
pp. 2034
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2021 ◽
Keyword(s):
2007 ◽