The influence of solvent residue, support type and UV-irradiation on surface morphology of poly(methyl methacrylate) films studied by Atomic Force Microscopy

Force Microscopy ◽

Atomic Force ◽

Solvent Residue ◽

Influence Of Solvent

Surface Morphology of Poly(butyl acrylate)/Poly(methyl methacrylate) Core Shell Latex by Atomic Force Microscopy

Langmuir ◽

10.1021/la00002a013 ◽

1995 ◽

Vol 11 (2) ◽

pp. 440-448 ◽

Cited By ~ 47

Author(s):

Francoise Sommer ◽

Tran Minh Duc ◽

Rosangela Pirri ◽

Gilles Meunier ◽

Christian Quet

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Methyl Methacrylate ◽

Butyl Acrylate ◽

Core Shell ◽

Force Microscopy ◽

Investigation of incubation in ArF excimer laser irradiated poly(methyl-methacrylate) using pulsed force mode atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.1803632 ◽

2004 ◽

Vol 96 (10) ◽

pp. 5548-5551 ◽

Cited By ~ 4

Author(s):

B. Hopp ◽

T. Smausz ◽

J. Kokavecz ◽

N. Kresz ◽

Z. Bor ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Excimer Laser ◽

Force Microscopy ◽

Atomic Force ◽

Force Mode ◽

Arf Excimer Laser ◽

Mode Atomic Force Microscopy

Nanostructure development in polystyrene-b -polybutadiene-b -poly(methyl methacrylate) (SBM) thin films by atomic force microscopy: Effect of copolymer composition and solvent

Polymer Engineering & Science ◽

10.1002/pen.24589 ◽

2017 ◽

Vol 58 (3) ◽

pp. 422-429 ◽

Cited By ~ 2

Author(s):

Loli Martin ◽

Lourdes Irusta ◽

Alba González ◽

Agnieszka Tercjak ◽

Galder Kortaberria

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Copolymer Composition ◽

Force Microscopy ◽

Submicron gold structures formed by atomic force microscopy lithography on thin films of poly(methyl methacrylate)

Surface Science ◽

10.1016/j.susc.2008.08.006 ◽

2008 ◽

Vol 602 (18) ◽

pp. 3051-3056 ◽

Cited By ~ 4

Author(s):

Kjell Ove Kongshaug ◽

Helge Steen

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Force Microscopy ◽

Crystallization Behavior of Single Isotactic Poly(methyl methacrylate) Chains Visualized by Atomic Force Microscopy

The Journal of Physical Chemistry B ◽

10.1021/jp5090923 ◽

2014 ◽

Vol 119 (1) ◽

pp. 338-347 ◽

Cited By ~ 12

Author(s):

Takahiro Anzai ◽

Mariko Kawauchi ◽

Takehiro Kawauchi ◽

Jiro Kumaki

Keyword(s):

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Crystallization Behavior ◽

Force Microscopy ◽

Monitoring Thermally Induced Cylindrical Microphase Separation of Polystyrene-block-poly(methyl methacrylate) by Atomic Force Microscopy

Journal of Photopolymer Science and Technology ◽

10.2494/photopolymer.29.659 ◽

2016 ◽

Vol 29 (5) ◽

pp. 659-665

Author(s):

Nobuya Hiroshiba ◽

Ryo Okubo ◽

Azusa N. Hattori ◽

Hidekazu Tanaka ◽

Masaru Nakagawa

Keyword(s):

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Microphase Separation ◽

Thermally Induced ◽

Force Microscopy ◽

Atomic force microscopy studies of poly(methyl methacrylate) doped with photoinitiator

Journal of Applied Polymer Science ◽

10.1002/app.34811 ◽

2011 ◽

Vol 123 (4) ◽

pp. 2458-2466 ◽

Cited By ~ 2

Author(s):

Halina Kaczmarek ◽

Piotr Gałka ◽

Aleksandra Szalla

Keyword(s):

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Force Microscopy ◽

Observations of crystallization and melting in poly(ethylene oxide)/poly(methyl methacrylate) blends by hot-stage atomic-force microscopy

Journal of Polymer Science Part B Polymer Physics ◽

10.1002/(sici)1099-0488(199810)36:14<2643::aid-polb17>3.0.co;2-b ◽

1998 ◽

Vol 36 (14) ◽

pp. 2643-2651 ◽

Cited By ~ 29

Author(s):

R. Pearce ◽

G. J. Vancso

Keyword(s):

Atomic Force Microscopy ◽

Ethylene Oxide ◽

Methyl Methacrylate ◽

Force Microscopy ◽

Atomic Force ◽

Poly Ethylene Oxide ◽

Poly Ethylene

Strong Compression Rate Dependence of Phase Separation and Stereocomplexation between Isotactic and Syndiotactic Poly(methyl methacrylate)s in a Langmuir Monolayer Observed by Atomic Force Microscopy

Langmuir ◽

10.1021/la1018289 ◽

2010 ◽

Vol 26 (15) ◽

pp. 12703-12708 ◽

Cited By ~ 8

Author(s):

Naoyuki Aiba ◽

Yuhtaro Sasaki ◽

Jiro Kumaki

Keyword(s):

Atomic Force Microscopy ◽

Phase Separation ◽

Methyl Methacrylate ◽

Langmuir Monolayer ◽

Rate Dependence ◽

Compression Rate ◽

Force Microscopy ◽

Atomic Force ◽

Strong Compression

Coaxial Electrospun Poly(methyl methacrylate)–Polyacrylonitrile Nanofibers: Atomic Force Microscopy and Compositional Characterization

The Journal of Physical Chemistry B ◽

10.1021/jp205577r ◽

2011 ◽

Vol 115 (43) ◽

pp. 12441-12447 ◽

Cited By ~ 25

Author(s):

Nicole E. Zander ◽

Kenneth E. Strawhecker ◽

Joshua A. Orlicki ◽

Adam M. Rawlett ◽

Thomas P. Beebe

Keyword(s):

Atomic Force Microscopy ◽

Methyl Methacrylate ◽

Force Microscopy ◽

Atomic Force ◽

Compositional Characterization