scholarly journals Toward non-default partitioning for compound feature identification in engineering design

Procedia CIRP ◽  
2021 ◽  
Vol 100 ◽  
pp. 852-857
Author(s):  
Yifan Qie ◽  
Nabil Anwer
Author(s):  
Shyam V. Narayan ◽  
Zhi-Kui Ling

Abstract Feature based modeling has been used as a means to bridge the gap between engineering design and manufacturing. Features can represent an artifact with higher level entities which relate directly to its design functionalities and manufacturing characteristics, such as surface finish, manufacturability, fits, tolerance etc. In this study, a heuristic based feature recognition approach is proposed by using the graph representation of a design. The process consists of two steps: subgraph construction, and subgraph to feature identification. In this study, the subgraph construction is accomplished by using a set of heuristic rules. The process of subgraph to feature identification is carried out with a set of integers and characters which represent the geometric, topological, and semantic characteristics of the corresponding feature. This feature recognition scheme is used for the identification of machine features in a design.


Author(s):  
Michael T. Postek

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.


2018 ◽  
Vol 1 (2) ◽  
Author(s):  
Matthew D. Doerfler ◽  
◽  
Katie N. Truitt ◽  
Mark J. Fisher ◽  
Grant Theron ◽  
...  

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