Synthesis and characterization of epoxy polymers containing azobenzene groups that exhibit optical birefringence

2008 ◽  
Vol 68 (1) ◽  
pp. 70-76 ◽  
Author(s):  
Raquel Fernández ◽  
Iñaki Mondragon ◽  
Patricia A. Oyanguren ◽  
María J. Galante
2011 ◽  
Vol 49 (15) ◽  
pp. 3291-3298 ◽  
Author(s):  
Javier Illescas ◽  
Yessica S. Ramirez-Fuentes ◽  
Ernesto Rivera ◽  
Omar G. Morales-Saavedra ◽  
Antonio A. Rodríguez-Rosales ◽  
...  

Materials ◽  
2020 ◽  
Vol 13 (8) ◽  
pp. 1912
Author(s):  
Karolina Bujak ◽  
Anna Kozanecka-Szmigiel ◽  
Ewa Schab-Balcerzak ◽  
Jolanta Konieczkowska

This paper describes the synthesis and characterization of new “T-type” azo poly(amide imide)s as well as guest-host systems based on the “T-type” matrices. The matrices possessed pyridine rings in a main-chain and azobenzene moieties located either between the amide or imide groups. The non-covalent polymers contained the molecularly dispersed 4-phenylazophenol or 4-[(4-methyl phenyl)diazinyl]phenol chromophores that are capable of forming intermolecular hydrogen bonds with the pyridine rings. The FTIR spectroscopy and the measurements of the thermal, optical and photoinduced optical birefringence were employed for the determination of the influence of H-bonds and the specific elements of polymer architecture on physicochemical properties. Moreover, the obtained results were compared to those described in our previous works to formulate structure-property relations that may be considered general for the class of “T-type” azo poly(amide imide)s.


1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.


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