Monitoring of the environmental pollution by trace element analysis in tree-rings using synchrotron radiation total reflection X-ray fluorescence

2006 ◽  
Vol 61 (10-11) ◽  
pp. 1170-1174 ◽  
Author(s):  
Ana Elisa Sirito de Vives ◽  
Silvana Moreira ◽  
Sandra Maria Boscolo Brienza ◽  
Jean Gabriel Silva Medeiros ◽  
Mário Tomazello Filho ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Environmental Pollution ◽  
Trace Element ◽  
Tree Rings ◽  
Trace Element Analysis ◽  
Total Reflection ◽  
Element Analysis ◽  
X Ray

scholarly journals Improvement in a Method for Trace Element Analysis Method Using a Portable Total Reflection X-ray Fluorescence Spectrometer

2019 ◽  
Vol 68 (5) ◽  
pp. 325-332
Author(s):  
Shinsuke KUNIMURA ◽  
Yugo SUGAWARA ◽  
Yoshie TOKUOKA ◽  
Umina AONO ◽  
Taishiro SUGIOKA ◽  
...  
Keyword(s):  
Trace Element ◽  
Trace Element Analysis ◽  
Total Reflection ◽  
Analysis Method ◽  
Element Analysis ◽  
X Ray ◽  
Fluorescence Spectrometer

Application of Synchrotron Radiation Excited X-Ray Fluorescence Analysis to Micro and Trace Element Determination

1985 ◽  
Vol 29 ◽  
pp. 427-434
Author(s):  
Atsuo lida ◽  
Yohichi Gohshi ◽  
Hideki Maezawa
Keyword(s):  
Synchrotron Radiation ◽  
Trace Element ◽  
Trace Element Analysis ◽  
Fluorescence Analysis ◽  
Light Elements ◽  
Element Analysis ◽  
Element Determination ◽  
Undulator Radiation ◽  
Silicon Compounds ◽  
X Ray

AbstractMicro and trace element analysis by X-ray fluorescence was carried out using synchrotron radiation from a bending magnet and an undulator for hard and soft X-ray excitation respectively. The minimum detection limits obtained in the hard X-ray region were less than pg, which corresponds to a spatial resolution of less than a hundred micronmeters, with a detection limit of a few ppm. Light elements such as oxygen, nitrogen and carbon in silicon compounds were analyzed by soft X-ray emission spectroscopy using undulator radiation. The minimum detectable amount of the light elements was greatly improved, since undulator radiation is very strong in intensity, and is highly collimated.

Trace Element Analysis by Synchrotron Radiation Excited XRF

1983 ◽  
Vol 27 ◽  
pp. 557-562
Author(s):  
S.T. Davies ◽  
D.K. Bowen ◽  
M. Prins ◽  
A.J.J. Bos
Keyword(s):  
Synchrotron Radiation ◽  
Trace Element ◽  
Trace Element Analysis ◽  
Science And Engineering ◽  
Element Analysis ◽  
Host Matrix ◽  
X Ray ◽  
Laser Microprobe ◽  
Fluorescence Methods ◽  
Electron Storage Rings

The ability rapidly and quantitatively to detect trace elements in a host matrix is of great importance in many areas of science and engineering. This fact is underlined by the considerable amount of effort that has been put into developing such techniques as electron probe microanalysis, proton Induced x-ray emission (Pixe), the laser microprobe mass analyser (Lamma) as well as conventional x-ray fluorescence methods. Recently the availability of electron storage rings partially or wholly dedicated to producing intense beams of synchrotron radiation has provided a new tpol to complement the above mentioned techniques. This paper reports on work at Daresbury Laboratory on synchrotron x-ray fluorescence (SXRF) fo r quantitative trace element analysis.

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