Application of Synchrotron Radiation Excited X-Ray Fluorescence Analysis to Micro and Trace Element Determination
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AbstractMicro and trace element analysis by X-ray fluorescence was carried out using synchrotron radiation from a bending magnet and an undulator for hard and soft X-ray excitation respectively. The minimum detection limits obtained in the hard X-ray region were less than pg, which corresponds to a spatial resolution of less than a hundred micronmeters, with a detection limit of a few ppm. Light elements such as oxygen, nitrogen and carbon in silicon compounds were analyzed by soft X-ray emission spectroscopy using undulator radiation. The minimum detectable amount of the light elements was greatly improved, since undulator radiation is very strong in intensity, and is highly collimated.
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1995 ◽
Vol 359
(1-2)
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pp. 327-330
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1998 ◽
Vol 5
(3)
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pp. 1114-1116
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2006 ◽
Vol 61
(10-11)
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pp. 1170-1174
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