Improvement of total reflection X-ray fluorescence spectrometer sensitivity by flowing nitrogen gas

2012 ◽  
Vol 73 ◽  
pp. 75-78 ◽  
Author(s):  
Susumu Imashuku ◽  
Deh Ping Tee ◽  
Jun Kawai
2014 ◽  
Vol 30 (1) ◽  
pp. 36-39
Author(s):  
Ying Liu ◽  
Susumu Imashuku ◽  
Jun Kawai

An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 1013 atoms cm−2.


2016 ◽  
Vol 122 (12) ◽  
Author(s):  
Alessia Coccato ◽  
Bart Vekemans ◽  
Laszlo Vincze ◽  
Luc Moens ◽  
Peter Vandenabeele

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