Transmission electron microscopy study of the role of interface structure at 100/111 boundaries in a shocked copper multicrystal

2012 ◽  
Vol 67 (4) ◽  
pp. 412-415 ◽  
Author(s):  
A.G. Perez-Bergquist ◽  
E.K. Cerreta ◽  
C.P. Trujillo ◽  
G.T. Gray ◽  
C. Brandl ◽  
...  
2010 ◽  
Vol 16 (S2) ◽  
pp. 1270-1271
Author(s):  
H Yoshida ◽  
T Shimizu ◽  
T Uchiyama ◽  
H Kohno ◽  
S Takeda

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.


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