High-resolution transmission electron microscopy study of interface structure and strain in epitaxial β-FeSi2 on Si (111) substrate

2003 ◽  
Vol 255 (1-2) ◽  
pp. 93-101 ◽  
Author(s):  
Ming Han ◽  
Miyoko Tanaka ◽  
Masaki Takeguchi ◽  
Qi Zhang ◽  
Kazuo Furuya
Sign in / Sign up

Export Citation Format

Share Document