An affordable, rapid determination of total lipid profile using paper-based microfluidic device

2019 ◽  
Vol 285 ◽  
pp. 405-412 ◽  
Author(s):  
Shahila Parween ◽  
Debishree Subudhi P. ◽  
Amit Asthana
1989 ◽  
Vol 35 (7) ◽  
pp. 1486-1491 ◽  
Author(s):  
L L Wu ◽  
G R Warnick ◽  
J T Wu ◽  
R R Williams ◽  
J M Lalouel

Abstract We describe a one-day micro-scale procedure for determining the total lipid profile. Only 0.55 mL of plasma is needed for complete quantification of total cholesterol (TC), triglyceride (TG), and all lipoproteins. After precipitation with dextran sulfate and magnesium, the high-density lipoprotein (HDL) fraction was separated by centrifugation in an Eppendorf microcentrifuge. Very-low-density lipoprotein (VLDL) was separated from low-density lipoprotein (LDL) plus HDL in a Beckman TL 100 ultracentrifuge. TC, TG, and cholesterol in different lipoprotein fractions were measured enzymatically in a Baker "Encore II" automated analyzer. CVs, both within-day and day-to-day, were less than 3% for TG and TC, and less than 5% for HDL-C determinations. CVs for LDL-C and VLDL-C were less than 7.5% and 15%, respectively. Results by our micromethods (n = 66) agreed well with those by the conventional methods used at the Northwest Lipid Research Center, which are standardized against the Reference Methods of the Centers for Disease Control. Coefficients of correlation between the two methods were 0.98 for TC, 1.0 for TG, 0.98 for HDL-C, 0.94 for LDL-C, and 0.96 for VLDL-C. Results of electrophoresis on agarose gel and radioactivity-recovery studies indicate that our micro-centrifugation and slicing procedures result in clean separation of VLDL from other lipoproteins.


Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu

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