Superior silicon surface passivation in HIT solar cells by optimizing a-SiOx:H thin films: A compact intrinsic passivation layer

Solar Energy ◽  
2017 ◽  
Vol 155 ◽  
pp. 670-678 ◽  
Author(s):  
Bin Zhang ◽  
Yu Zhang ◽  
Ridong Cong ◽  
Yun Li ◽  
Wei Yu ◽  
...  
Keyword(s):  
Thin Films ◽  
Solar Cells ◽  
Silicon Surface ◽  
Surface Passivation ◽  
Passivation Layer ◽  
Silicon Surface Passivation

A Nanocrystalline Silicon Surface-Passivation Layer on an HR-Si Substrate for RFICs

2011 ◽  
Vol 32 (3) ◽  
pp. 369-371 ◽  
Author(s):  
Chao-Jung Chen ◽  
Ruey-Lue Wang ◽  
Yan-Kuin Su ◽  
Ting-Jen Hsueh
Keyword(s):  
Silicon Surface ◽  
Surface Passivation ◽  
Nanocrystalline Silicon ◽  
Passivation Layer ◽  
Si Substrate ◽  
Silicon Surface Passivation

Silicon surface passivation by polystyrenesulfonate thin films

2017 ◽  
Vol 110 (8) ◽  
pp. 083904 ◽  
Author(s):  
Jianhui Chen ◽  
Yanjiao Shen ◽  
Jianxin Guo ◽  
Bingbing Chen ◽  
Jiandong Fan ◽  
...  
Keyword(s):  
Thin Films ◽  
Silicon Surface ◽  
Surface Passivation ◽  
Silicon Surface Passivation

Silicon surface passivation by hot-wire CVD Si thin films studied by in situ surface spectroscopy

2009 ◽  
Vol 517 (12) ◽  
pp. 3456-3460 ◽  
Author(s):  
J.J.H. Gielis ◽  
B. Hoex ◽  
P.J. van den Oever ◽  
M.C.M. van de Sanden ◽  
W.M.M. Kessels
Keyword(s):  
Thin Films ◽  
Silicon Surface ◽  
Surface Passivation ◽  
Hot Wire ◽  
Surface Spectroscopy ◽  
Silicon Surface Passivation

scholarly journals Sensing amorphous/crystalline silicon surface passivation by attenuated total reflection infrared spectroscopy of amorphous silicon on glass -=SUP=-*-=/SUP=-

2019 ◽  
Vol 53 (8) ◽  
pp. 1140
Author(s):  
S.N. Abolmasov ◽  
A.S. Abramov ◽  
A.V. Semenov ◽  
I.S. Shakhray ◽  
E.I. Terukov ◽  
...  
Keyword(s):  
Solar Cells ◽  
Amorphous Silicon ◽  
Silicon Surface ◽  
Surface Passivation ◽  
Crystalline Silicon ◽  
Total Reflection ◽  
Effective Lifetime ◽  
Heterojunction Solar Cells ◽  
Silicon Surface Passivation ◽  
Silicon Heterojunction Solar Cells

AbstractAttenuated total reflection Fourier transform infrared (ATR FTIR) spectroscopy and effective lifetime measurements have been used to characterize amorphous/crystalline silicon surface passivation in silicon heterojunction solar cells. The comparative studies show a strong link between microstructure factor R * and effective lifetime of amorphous silicon ( a -Si:H) passivation layers incorporating an interface buffer layer, which prevents the epitaxial growth. It is demonstrated that thin a -Si:H films deposited on glass can be used as ATR substrates in this case. The obtained results show that a -Si:H films with R * close to 0.1 are required for manufacturing of high-efficiency (>23%) silicon heterojunction solar cells.

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