A correlative investigation of grain boundary crystallography and electronic properties in CdTe thin film solar cells

2017 ◽  
Vol 166 ◽  
pp. 108-120 ◽  
Author(s):  
Guillaume Stechmann ◽  
Stefan Zaefferer ◽  
Torsten Schwarz ◽  
Peter Konijnenberg ◽  
Dierk Raabe ◽  
...  
2003 ◽  
Vol 431-432 ◽  
pp. 84-89 ◽  
Author(s):  
T Schulmeyer ◽  
J Fritsche ◽  
A Thißen ◽  
A Klein ◽  
W Jaegermann ◽  
...  

2003 ◽  
Vol 763 ◽  
Author(s):  
D. Kraft ◽  
B. Späth ◽  
A. Thißen ◽  
A. Klein ◽  
W. Jaegermann

AbstractFormation of low resistance back contacts in CdTe thin film solar cells has been a research issue for many years. Ohmic contacts to the absorber layer are typically prepared using the diffusion of dopant atoms from the back contact material into the CdTe forming a thin space charge layer that can be easily tunnelled. Stable CdTe solar cells with reasonable back contact characteristics have been prepared using metal/Sb2Te3 layer sequences. In this study the chemical and electronic properties of such layer systems have been investigated using photoelectron spectroscopy. The vacuum deposited Sb2Te3 layers do not react with the CdTe substrate. Band alignment does not indicate the formation of a good back contact. By subsequent deposition of metals a chemical reaction is induced forming metal-tellurides, a metal/Sb-alloy and elemental Sb. Although an Sb diffusion into the CdTe absorber is observed, no increase of p-doping in the surface region is evident.


2011 ◽  
Vol 20 (3) ◽  
pp. 037103 ◽  
Author(s):  
Bing Li ◽  
Liang-Huan Feng ◽  
Zhao Wang ◽  
Xu Zheng ◽  
Jia-Gui Zheng ◽  
...  

2002 ◽  
Vol 41 (Part 1, No. 5A) ◽  
pp. 2834-2841 ◽  
Author(s):  
Nowshad Amin ◽  
Akira Yamada ◽  
Makoto Konagai

2014 ◽  
Vol 16 (19) ◽  
pp. 8843 ◽  
Author(s):  
Fabian Pianezzi ◽  
Patrick Reinhard ◽  
Adrian Chirilă ◽  
Benjamin Bissig ◽  
Shiro Nishiwaki ◽  
...  

2007 ◽  
Vol 515 (15) ◽  
pp. 5792-5797 ◽  
Author(s):  
Lianghuan Feng ◽  
Lili Wu ◽  
Zhi Lei ◽  
Wei Li ◽  
Yaping Cai ◽  
...  

2012 ◽  
Vol 99 ◽  
pp. 349-355 ◽  
Author(s):  
Hao Lin ◽  
Irfan ◽  
Wei Xia ◽  
Hsiang N. Wu ◽  
Yongli Gao ◽  
...  

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