Atomic force acoustic microscopy characterization of nanostructured selenium–tin thin films

2008 ◽  
Vol 44 (4-5) ◽  
pp. 641-649 ◽  
Author(s):  
D. Passeri ◽  
M. Rossi ◽  
A. Alippi ◽  
A. Bettucci ◽  
D. Manno ◽  
...  
Keyword(s):  
Thin Films ◽  
Acoustic Microscopy ◽  
Atomic Force ◽  
Tin Thin Films ◽  
Microscopy Characterization

Atomic force acoustic microscopy characterization of carbon-based materials

2007 ◽  
Author(s):  
D. Passeri ◽  
A. Bettucci ◽  
M. Germano ◽  
A. Biagioni ◽  
M. Rossi ◽  
...  
Keyword(s):  
Acoustic Microscopy ◽  
Atomic Force ◽  
Microscopy Characterization ◽  
Carbon Based

scholarly journals Mechanical characterization of porous nano-thin films by use of atomic force acoustic microscopy

2016 ◽  
Vol 162 ◽  
pp. 82-90 ◽  
Author(s):  
M. Kopycinska-Müller ◽  
A. Clausner ◽  
K.-B. Yeap ◽  
B. Köhler ◽  
N. Kuzeyeva ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Characterization ◽  
Acoustic Microscopy ◽  
Atomic Force

Mechanical Characterization of Thin Films by Use of Atomic Force Acoustic Microscopy

2010 ◽  
Vol 13 (4) ◽  
pp. 312-318 ◽  
Author(s):  
Malgorzata Kopycinska-Müller ◽  
Andre Striegler ◽  
Bernd Köhler ◽  
Klaus-Jürgen Wolter
Keyword(s):  
Thin Films ◽  
Mechanical Characterization ◽  
Acoustic Microscopy ◽  
Atomic Force

Atomic Force Microscopy Characterization of ZnTe Epitaxial Thin Films

2003 ◽  
Vol 42 (Part 1, No. 7B) ◽  
pp. 4706-4709 ◽  
Author(s):  
Petr Klapetek ◽  
Ivan Ohlídal ◽  
Alberto Montaigne-Ramil ◽  
Alberta Bonanni ◽  
David Stifter ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Epitaxial Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Characterization ◽  
Atomic Force Microscopy Characterization
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