Characterization of polymer thin films by phase-sensitive acoustic microscopy and atomic force microscopy: a comparative review

2005 ◽  
Vol 218 (3) ◽  
pp. 208-218 ◽  
Author(s):  
W. NGWA ◽  
W. LUO ◽  
A. KAMANYI ◽  
K. W. FOMBA ◽  
W. GRILL
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Polymer Thin Films ◽  
Acoustic Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Comparative Review ◽  
Phase Sensitive

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy

2006 ◽  
Vol 38 (4) ◽  
pp. 842-846 ◽  
Author(s):  
Daniel Franta ◽  
Ivan Ohlídal ◽  
Petr Klapetek ◽  
Růžena Nepustilová ◽  
Svatopluk Bajer
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Optical Method ◽  
Polymer Thin Films ◽  
Aluminum Films ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

2013 ◽  
Vol 4 ◽  
pp. 815-833 ◽  
Author(s):  
Sidney R Cohen ◽  
Estelle Kalfon-Cohen
Keyword(s):  
Atomic Force Microscopy ◽  
Time And Space ◽  
Material Response ◽  
Force Microscopy ◽  
Atomic Force ◽  
Important Phenomenon ◽  
Comparative Review ◽  
Key Techniques ◽  
Dynamic Nanoindentation

Viscoelasticity is a complex yet important phenomenon that drives material response at different scales of time and space. Burgeoning interest in nanoscale dynamic material mechanics has driven, and been driven by two key techniques: instrumented nanoindentation and atomic force microscopy. This review provides an overview of fundamental principles in nanoindentation, and compares and contrasts these two techniques as they are used for characterization of viscoelastic processes at the nanoscale.

Mechanical characterization of polymeric thin films by atomic force microscopy based techniques

2012 ◽  
Vol 405 (5) ◽  
pp. 1463-1478 ◽  
Author(s):  
Daniele Passeri ◽  
Marco Rossi ◽  
Emanuela Tamburri ◽  
Maria Letizia Terranova
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Mechanical Characterization ◽  
Polymeric Thin Films ◽  
Force Microscopy ◽  
Atomic Force

Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

2004 ◽  
Vol 20-21 ◽  
pp. 611-616
Author(s):  
José M. Barandiarán ◽  
Iñaki Orue ◽  
M.L. Fdez-Gubieda ◽  
A. García Prieto
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Force Microscopy ◽  
Atomic Force
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