A review of electrical characterization techniques for ultrathin FDSOI materials and devices

2016 ◽  
Vol 117 ◽  
pp. 10-36 ◽  
Author(s):  
Sorin Cristoloveanu ◽  
Maryline Bawedin ◽  
Irina Ionica
2014 ◽  
Vol 2 (17) ◽  
pp. 3172-3184 ◽  
Author(s):  
D. Bozyigit ◽  
V. Wood

Here we provide a primer for correctly selecting and implementing optoelectronic characterization techniques on semiconductor nanocrystal solids and choosing the appropriate models with which to interpret the data.


Sign in / Sign up

Export Citation Format

Share Document