Epitaxial staircase structure for the calibration of electrical characterization techniques

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.589820 ◽

1998 ◽

Vol 16 (1) ◽

pp. 394 ◽

Author(s):

T. Clarysse

Keyword(s):

Electrical Characterization ◽

Characterization Techniques ◽

Staircase Structure

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Determination of spatial resolution in atomic-force-microscopy-based electrical characterization techniques using quantum well structures

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1835317 ◽

2005 ◽

Vol 23 (1) ◽

pp. 61 ◽

Author(s):

O. Douhéret ◽

S. Bonsels ◽

S. Anand

Keyword(s):

Atomic Force Microscopy ◽

Quantum Well ◽

Spatial Resolution ◽

Electrical Characterization ◽

Quantum Well Structures ◽

Force Microscopy ◽

Characterization Techniques ◽

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Electrical Characterization Techniques for Porous Silicon

Handbook of Porous Silicon ◽

10.1007/978-3-319-71381-6_111 ◽

2018 ◽

pp. 655-672

Author(s):

Magdalena Lidia Ciurea ◽

Ana-Maria Lepadatu

Keyword(s):

Porous Silicon ◽

Electrical Characterization ◽

Characterization Techniques

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Electrical Characterization Techniques for Silicon on Insulator Materials and Devices

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_12 ◽

1995 ◽

pp. 109-132 ◽

Author(s):

Sorin Cristoloveanu

Keyword(s):

Electrical Characterization ◽

Silicon On Insulator ◽

Characterization Techniques

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Charge transfer and recombination kinetics in dye-sensitized solar cell using static and dynamic electrical characterization techniques

Solar Energy ◽

10.1016/j.solener.2014.06.037 ◽

2014 ◽

Vol 108 ◽

pp. 107-116 ◽

Author(s):

Brijesh Tripathi ◽

Pankaj Yadav ◽

Manoj Kumar

Keyword(s):

Charge Transfer ◽

Electrical Characterization ◽

Dye Sensitized Solar Cell ◽

Dye Sensitized ◽

Characterization Techniques ◽

Recombination Kinetics

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Single Cell Electrical Characterization Techniques

Handbook of Electroporation ◽

10.1007/978-3-319-32886-7_15 ◽

2017 ◽

pp. 271-288 ◽

Author(s):

Olivier Français ◽

Bruno Le Pioufle

Keyword(s):

Single Cell ◽

Electrical Characterization ◽

Characterization Techniques

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A review on electrical characterization techniques performed to study the device performance of quantum dot sensitized solar cells

Solar Energy ◽

10.1016/j.solener.2017.11.037 ◽

2018 ◽

Vol 159 ◽

pp. 682-696 ◽

Author(s):

J. Kusuma ◽

R. Geetha Balakrishna

Keyword(s):

Solar Cells ◽

Quantum Dot ◽

Electrical Characterization ◽

Device Performance ◽

Characterization Techniques ◽

Sensitized Solar Cells

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A review of electrical characterization techniques for ultrathin FDSOI materials and devices

Solid-State Electronics ◽

10.1016/j.sse.2015.11.007 ◽

2016 ◽

Vol 117 ◽

pp. 10-36 ◽

Author(s):

Sorin Cristoloveanu ◽

Maryline Bawedin ◽

Irina Ionica

Keyword(s):

Electrical Characterization ◽

Characterization Techniques

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Electrical characterization of nanocrystal solids

Journal of Materials Chemistry C ◽

10.1039/c3tc32235a ◽

2014 ◽

Vol 2 (17) ◽

pp. 3172-3184 ◽

Author(s):

D. Bozyigit ◽

V. Wood

Keyword(s):

Electrical Characterization ◽

Semiconductor Nanocrystal ◽

Characterization Techniques

Here we provide a primer for correctly selecting and implementing optoelectronic characterization techniques on semiconductor nanocrystal solids and choosing the appropriate models with which to interpret the data.

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Corrigendum to “A review on electrical characterization techniques performed to study the device performance of quantum dot sensitized solar cells” [Solar Energy 159 (2018) 682–696]

Solar Energy ◽

10.1016/j.solener.2017.12.012 ◽

2018 ◽

Vol 160 ◽

pp. 251

Author(s):

J. Kusuma ◽

R. Geetha Balakrishna

Keyword(s):

Solar Cells ◽

Solar Energy ◽

Quantum Dot ◽

Electrical Characterization ◽

Device Performance ◽

Characterization Techniques ◽

Sensitized Solar Cells

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Investigation of the Interfaces in Ni-FUSI/Hf-Based/Si and Ni-FUSI/SiO2/Si Stacks by Physical and Electrical Characterization Techniques

Journal of Electronic Materials ◽

10.1007/s11664-009-0955-4 ◽

2009 ◽

Vol 38 (11) ◽

pp. 2314-2322 ◽

Author(s):

S. Y. Tan

Keyword(s):

Electrical Characterization ◽

Characterization Techniques

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