Characterization of oxide-supported Cu by infrared measurements on adsorbed CO

2021 ◽  
Vol 703 ◽  
pp. 121725 ◽  
Author(s):  
Niels D. Nielsen ◽  
Thomas E.L. Smitshuysen ◽  
Christian D. Damsgaard ◽  
Anker D. Jensen ◽  
Jakob M. Christensen
1973 ◽  
Vol 26 (8) ◽  
pp. 1645 ◽  
Author(s):  
EM Krankovits ◽  
RJ Magee ◽  
MJ O'Conner

The preparation of a number of polymeric, octahedral bis(N- alkylmonothiocarbamato)nickel(II) complexes and some of their base adducts is described. ��� The preparation and characterization of some bis(phosphine)bis(N- alkylmono-thiocarbamato)palladium(II) compounds are also described for the first time. The butyl compound is monomeric in chloroform and infrared spectral measurements of all compounds indicate that the monothiocarbamate ligands are bonded to palladium through the sulphur atoms only. The proton magnetic resonance spectrum of the dimethylphenylphosphine complex shows clearly that the phosphine groups are trans in the complexes. ��� Simple bis(monothiocarbamato)-palladium(II) or -platinum(II) have not been isolated but pyrrolidinium tetra(N- pyrrolidylmonothiocarbamato)-palladium(II) or -platinum(II) compounds are formed. Infrared measurements indicate that the mono-thiocarbamate ligands are bonded to the metal through both oxygen and sulphur atoms but no definite structure can be proposed for these compounds at present.


2004 ◽  
Vol 43 (29) ◽  
pp. 5503 ◽  
Author(s):  
Alexander Yu. Zasetsky ◽  
Alexei F. Khalizov ◽  
James J. Sloan

2007 ◽  
Vol 79 (6) ◽  
pp. 795-806 ◽  
Author(s):  
M. Mihaylov ◽  
H. Knözinger ◽  
K. Hadjiivanov ◽  
B. C. Gates

2006 ◽  
Vol 237 (2) ◽  
pp. 431-434 ◽  
Author(s):  
F MENEGAZZO ◽  
M MANZOLI ◽  
A CHIORINO ◽  
F BOCCUZZI ◽  
T TABAKOVA ◽  
...  

ChemInform ◽  
2007 ◽  
Vol 38 (36) ◽  
Author(s):  
Mihail Mihaylov ◽  
Helmut Knoezinger ◽  
Konstantin Hadjiivanov ◽  
Bruce C. Gates

2020 ◽  
Vol 35 ◽  
pp. 101310
Author(s):  
Corentin Douellou ◽  
Xavier Balandraud ◽  
Emmanuel Duc ◽  
Benoit Verquin ◽  
Fabien Lefebvre ◽  
...  

2008 ◽  
Vol 8 (3) ◽  
pp. 1350-1354 ◽  
Author(s):  
Xiaopeng Hao ◽  
Chunlan Zhou ◽  
Runsheng Yu ◽  
Baoyi Wang ◽  
Long Wei

Si-implanted thermal SiO2 layers and their annealing behaviour were investigated. In the results of variable-energy positron annihilation spectroscopy, the defects caused by ion implantation are manifested as a particularly low S parameter in the Si ion implantation region of the SiO2 layer. Compared with Fourier transform infrared measurements, it suggests that the decrease of the line shape S parameter after implantation is related to the compaction of implanted layers induced by the breaking of the SiO2 network structure. The presence of blue band emission (430–470 nm) in the implanted SiO2 layer is associated with neutral oxygen vacancy. An increase of the S parameter in the implanted layers is observed after annealing at different temperatures, but it is impossible completely recover the pre-implantation condition after a thermal treatment.


2016 ◽  
Vol 43 (12) ◽  
pp. 6220-6227 ◽  
Author(s):  
S. De Angelis ◽  
O. D. Lamb ◽  
A. Lamur ◽  
A. J. Hornby ◽  
F. W. von Aulock ◽  
...  

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