Film thickness by interference pattern and optical characterization of polyaniline by spectroscopic ellipsometry

Synthetic Metals ◽

10.1016/j.synthmet.2016.11.025 ◽

2017 ◽

Vol 223 ◽

pp. 80-86 ◽

Author(s):

Joaquim Brasil de Lima Filho ◽

Ángel Alberto Hidalgo

Keyword(s):

Film Thickness ◽

Interference Pattern ◽

Spectroscopic Ellipsometry ◽

Optical Characterization

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Optical characterization of hybrid PEDOT:PSS/Si heterostructures by spectroscopic ellipsometry

Molecular Crystals and Liquid Crystals ◽

10.1080/15421406.2020.1860533 ◽

2021 ◽

Vol 717 (1) ◽

pp. 92-97

Author(s):

O. S. Kondratenko ◽

S. V. Mamykin ◽

T. S. Lunko ◽

I. B. Mamontova ◽

V. R. Romanyuk

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization

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Optical characterization of textured SnO2:F layers using spectroscopic ellipsometry

Journal of Applied Physics ◽

10.1063/1.4759054 ◽

2012 ◽

Vol 112 (8) ◽

pp. 083507 ◽

Author(s):

Masataka Akagawa ◽

Hiroyuki Fujiwara

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization

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Optical Characterization of Varnish Films by Spectroscopic Ellipsometry for Application in Artwork Conservation

Applied Spectroscopy ◽

10.1366/0003702052940594 ◽

2005 ◽

Vol 59 (1) ◽

pp. 94-99 ◽

Author(s):

Kyriaki Polikreti ◽

Andreas Othonos ◽

Constantinos Christofides

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization

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Optical characterization of CuIn1−xGaxSe2 alloy thin films by spectroscopic ellipsometry

Journal of Applied Physics ◽

10.1063/1.1581345 ◽

2003 ◽

Vol 94 (2) ◽

pp. 879-888 ◽

Author(s):

P. D. Paulson ◽

R. W. Birkmire ◽

W. N. Shafarman

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization

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Optical characterization of SnO2:F films by spectroscopic ellipsometry

Journal of Non-Crystalline Solids ◽

10.1016/j.jnoncrysol.2010.07.007 ◽

2010 ◽

Vol 356 (41-42) ◽

pp. 2192-2197 ◽

Author(s):

F. Atay ◽

V. Bilgin ◽

I. Akyuz ◽

E. Ketenci ◽

S. Kose

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization

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Optical characterization of two-dimensional photonic crystals based on spectroscopic ellipsometry with rigorous coupled-wave analysis

Microelectronic Engineering ◽

10.1016/j.mee.2006.01.135 ◽

2006 ◽

Vol 83 (4-9) ◽

pp. 1798-1804 ◽

Author(s):

Chun-Hung Lin ◽

Hsuen-Li Chen ◽

Wen-Chi Chao ◽

Chung-I Hsieh ◽

Wen-Huei Chang

Keyword(s):

Photonic Crystals ◽

Spectroscopic Ellipsometry ◽

Optical Characterization ◽

Two Dimensional ◽

Wave Analysis ◽

Rigorous Coupled Wave Analysis ◽

Rigorous Coupled Wave ◽

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Optical characterization of thin films of some phthalocyanines by spectroscopic ellipsometry

Thin Solid Films ◽

10.1016/0040-6090(90)90204-q ◽

1990 ◽

Vol 188 (1) ◽

pp. 181-192 ◽

Author(s):

J Mårtensson ◽

H Arwin

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization

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The optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application

Materials Research Bulletin ◽

10.1016/j.materresbull.2016.01.021 ◽

2016 ◽

Vol 77 ◽

pp. 115-121

Author(s):

C. Özaydın ◽

Ö. Güllü ◽

O. Pakma ◽

S. Ilhan ◽

K. Akkılıç

Keyword(s):

Spectroscopic Ellipsometry ◽

Optical Characterization ◽

Organometallic Complex

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Optical Characterization of Very Thin Hydrogenated Amorphous Silicon Films Using Spectroscopic Ellipsometry

Japanese Journal of Applied Physics ◽

10.1143/jjap.30.l1914 ◽

1991 ◽

Vol 30 (Part 2, No. 11B) ◽

pp. L1914-L1916 ◽

Author(s):

Tadashi Saitoh ◽

Nobuyasu Hori ◽

Katsuyuki Suzuki ◽

Shigeo Iida

Keyword(s):

Amorphous Silicon ◽

Spectroscopic Ellipsometry ◽

Hydrogenated Amorphous Silicon ◽

Optical Characterization ◽

Silicon Films ◽

Hydrogenated Amorphous

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Optical Characterization of the Twisted Nematic Liquid Crystal Display

MRS Proceedings ◽

10.1557/proc-1242-s4-p02 ◽

2009 ◽

Vol 1242 ◽

Author(s):

Carolina Rickenstorff ◽

A. S. Ostrovsky

Keyword(s):

Liquid Crystal ◽

Interference Pattern ◽

Nematic Liquid Crystal ◽

Phase Modulation ◽

Liquid Crystal Display ◽

Optical Characterization ◽

Twisted Nematic ◽

Twisted Nematic Liquid Crystal

ABSTRACTA simple optical characterization technique is developed for to find the amplitude and phase modulation modes for the twisted nematic liquid crystal display (TN-LCD). The developed technique is based on intensity and pixel shift measurements of the interference pattern obtained from the TN-LCD sandwiched between two polarizers in a modified Young's experiment. Particularly, specimen LC2002 Holoeye is characterized and its amplitude and phase modulation curves as a function of image's gray level, bright B and contrast C are presented.

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