The optical characterization of organometallic complex thin films by spectroscopic ellipsometry and photovoltaic diode application

2016 ◽  
Vol 77 ◽  
pp. 115-121
Author(s):  
C. Özaydın ◽  
Ö. Güllü ◽  
O. Pakma ◽  
S. Ilhan ◽  
K. Akkılıç
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Organometallic Complex

Optical characterization of CuIn1−xGaxSe2 alloy thin films by spectroscopic ellipsometry

2003 ◽  
Vol 94 (2) ◽  
pp. 879-888 ◽  
Author(s):  
P. D. Paulson ◽  
R. W. Birkmire ◽  
W. N. Shafarman
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization

Optical characterization of thin films of some phthalocyanines by spectroscopic ellipsometry

1990 ◽  
Vol 188 (1) ◽  
pp. 181-192 ◽  
Author(s):  
J Mårtensson ◽  
H Arwin
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization

Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry

2016 ◽  
Vol 851 ◽  
pp. 199-204 ◽  
Author(s):  
Veronika Schmiedova ◽  
Jan Pospisil ◽  
Oldrich Zmeskal ◽  
Viliam Vretenar
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Graphene Oxide ◽  
Spectroscopic Ellipsometry ◽  
Inkjet Printing ◽  
Optical Characterization ◽  
Thermal Reduction ◽  
Visible Range ◽  
Dispersion Function

The paper deals with the study of optical properties of graphene oxide (GO) by inkjet printing. Defined structure of GO can be obtained by reducing of prepared layers either by heating or by UV radiation (rGO). The dispersion function for refractive index and extinction coefficient of GO and both rGO thin films were measured by spectroscopic ellipsometry in the wavelength range of 200 – 850 nm. Spectroscopic ellipsometry (SE) was used characterize the optical response of layer of GO reduced by UV and thermal reduction GO in visible range.

Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques

2015 ◽  
Vol 39 ◽  
pp. 735-741 ◽  
Author(s):  
E.R. Shaaban ◽  
M. El-Hagary ◽  
M. Emam-Ismail ◽  
A.M. Abd Elnaeim ◽  
S.H. Moustafa ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

Optical characterization of the annealing effect on Ge5Te20Se75 thin films by variable angle of-incidence spectroscopic ellipsometry

Optik ◽  
2016 ◽  
Vol 127 (8) ◽  
pp. 3871-3877 ◽  
Author(s):  
F. Abdel-Wahab ◽  
A. Merazga ◽  
M.S. Rasheedy ◽  
A.A. Montaser
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Annealing Effect ◽  
Angle Of Incidence ◽  
Variable Angle

Optical characterization of sputtered amorphous aluminum nitride thin films by spectroscopic ellipsometry

2005 ◽  
Vol 351 (40-42) ◽  
pp. 3334-3340 ◽  
Author(s):  
Jebreel M. Khoshman ◽  
Martin E. Kordesch
Keyword(s):  
Thin Films ◽  
Aluminum Nitride ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization
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