Comparison of ordered structure in buried oxide layers in high-dose, low-dose, and internal-thermal-oxidation separation-by-implanted-oxygen wafers

2005 ◽  
Vol 476 (1) ◽  
pp. 125-129
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K. Fukuda ◽  
K. Yasutake ◽  
T. Hosoi ◽  
M. Umeno
ChemInform ◽  
2010 ◽  
Vol 28 (43) ◽  
pp. no-no
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W. SKORUPA

1995 ◽  
Vol 28 (1-4) ◽  
pp. 411-414 ◽  
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Keyword(s):  
Low Dose ◽  

1996 ◽  
Vol 36 (1-3) ◽  
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Author(s):  
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S. Hopfe ◽  
J.-Y. Huh ◽  
U. Gösele

1997 ◽  
Vol 144 (6) ◽  
pp. 2205-2210 ◽  
Author(s):  
E. Schroer ◽  
S. Hopfe ◽  
Q. Y. Tong ◽  
U. Gösele ◽  
W. Skorupa

1987 ◽  
Vol 30 (1-4) ◽  
pp. 390-396 ◽  
Author(s):  
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J.A. Kilner ◽  
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1989 ◽  
Vol 18 (3) ◽  
pp. 385-389 ◽  
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S. S. Li ◽  
W. A. Krull

2002 ◽  
Vol 80 (5) ◽  
pp. 880-882 ◽  
Author(s):  
Meng Chen ◽  
Xiang Wang ◽  
Jing Chen ◽  
Xianghua Liu ◽  
Yeming Dong ◽  
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2002 ◽  
Author(s):  
Meng Chen ◽  
Xi Wang Xiang Wang ◽  
Yeming Dong ◽  
Xianghua Liu ◽  
Wangbin Yi ◽  
...  
Keyword(s):  
Low Dose ◽  

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