Comparison of ordered structure in buried oxide layers in high-dose, low-dose, and internal-thermal-oxidation separation-by-implanted-oxygen wafers
Keyword(s):
Low Dose
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1995 ◽
Vol 28
(1-4)
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pp. 411-414
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1987 ◽
Vol 19-20
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pp. 290-293
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1996 ◽
Vol 36
(1-3)
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pp. 237-240
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1997 ◽
Vol 144
(6)
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pp. 2205-2210
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Optical and compositional studies of buried oxide layers in silicon formed by high dose implantation
1987 ◽
Vol 30
(1-4)
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pp. 390-396
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1989 ◽
Vol 18
(3)
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pp. 385-389
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