Characterization of a-Si:H thin layers incorporated into textured a-Si:H/c-Si solar cell structures by spectroscopic ellipsometry using a tilt-angle optical configuration

2014 ◽  
Vol 569 ◽  
pp. 64-69 ◽  
Author(s):  
Yoshikazu Tanaka ◽  
Nobuyuki Matsuki ◽  
Hiroyuki Fujiwara
Keyword(s):  
Solar Cell ◽  
Spectroscopic Ellipsometry ◽  
Tilt Angle ◽  
Thin Layers ◽  
Si Solar Cell ◽  
Cell Structures ◽  
Optical Configuration

scholarly journals Characterization of μc-Si:H/a-Si:H tandem solar cell structures by spectroscopic ellipsometry

2014 ◽  
Vol 571 ◽  
pp. 756-761 ◽  
Author(s):  
Daisuke Murata ◽  
Tetsuya Yuguchi ◽  
Hiroyuki Fujiwara
Keyword(s):  
Solar Cell ◽  
Spectroscopic Ellipsometry ◽  
Tandem Solar Cell ◽  
Cell Structures

Characterization of the defect density states in MoOx for c-Si solar cell applications

2021 ◽  
pp. 108135
Author(s):  
D. Scirè ◽  
R. Macaluso ◽  
M. Mosca ◽  
S. Mirabella ◽  
A. Gulino ◽  
...  
Keyword(s):  
Solar Cell ◽  
Defect Density ◽  
Si Solar Cell

Characterization of InGaAsN solar-cell structures on Ge substrates

2014 ◽  
Vol 11 (3-4) ◽  
pp. 561-564 ◽  
Author(s):  
K. Uesugi ◽  
S. Kuboya ◽  
S. Sanorpim ◽  
K. Onabe
Keyword(s):  
Solar Cell ◽  
Cell Structures

Recent Advances in A-Si Solar Cell Technology in Japan

1986 ◽  
Vol 70 ◽  
Author(s):  
Y. Kuwano
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
Single Junction ◽  
Si Solar Cell ◽  
Si Solar Cells ◽  
Recent Advances ◽  
Cell Structures ◽  
Cell Stability ◽  
Terminal Structure ◽  
Conversion Efficiencies

ABSTRACTRecent advances in a-Si solar cells in Japan are reviewed. Improvements in single-junction and multi-junction solar cells are described in three main points, namely, fabrication methods, materials, and cell structures. Recently, a conversion efficiency of 11.7% was obtained for a single-junction structure. For an a-Si/poly-Si stacked structure and an a-Si/(CdS/CdTe) 4 terminal structure, conversion efficiencies of more than 13% were achieved.Then recent advances in the prevention of the light induced degradation of a-Si solar cells is mentioned. Several methods which can improve the a-Si solar cell stability are described.Finally, the present status of the industrialization of a-Si solar cells and some of the latest applications are described together with their propects.

Real time spectroscopic ellipsometry for characterization and optimization of amorphous silicon-based solar cell structures

1998 ◽  
Vol 313-314 ◽  
pp. 469-473 ◽  
Author(s):  
Joohyun Koh ◽  
H. Fujiwara ◽  
Yiwei Lu ◽  
C.R. Wronski ◽  
R.W. Collins
Keyword(s):  
Solar Cell ◽  
Amorphous Silicon ◽  
Real Time ◽  
Spectroscopic Ellipsometry ◽  
Cell Structures ◽  
Silicon Based
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