Characterization of a-Si:H thin layers incorporated into textured a-Si:H/c-Si solar cell structures by spectroscopic ellipsometry using a tilt-angle optical configuration
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2014 ◽
Vol 11
(3-4)
◽
pp. 561-564
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1996 ◽
Vol 41-42
◽
pp. 281-294
◽
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