Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy
2009 ◽
Vol 109
(10)
◽
pp. 1236-1244
◽
2009 ◽
Vol 15
(S2)
◽
pp. 464-465
◽
2018 ◽
Vol 766
◽
pp. 123-130
◽
2006 ◽
Vol 223
(3)
◽
pp. 172-178
◽
2011 ◽
Vol 50
◽
pp. 126603
◽