Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy

Dark Field ◽

Atomic Resolution ◽

High Angle ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Resolution Mapping

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2009.05.010 ◽

2009 ◽

Vol 109 (10) ◽

pp. 1236-1244 ◽

Cited By ~ 151

Author(s):

S. Van Aert ◽

J. Verbeeck ◽

R. Erni ◽

S. Bals ◽

M. Luysberg ◽

...

Keyword(s):

Electron Microscopy ◽

Dark Field ◽

Atomic Resolution ◽

High Angle ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Resolution Mapping

Omega transitional structure associated with {112} deformation twinning in a metastable beta Ti-Nb alloy, revealed by atomic resolution high-angle annular dark-field scanning transmission electron microscopy

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2018.06.281 ◽

2018 ◽

Vol 766 ◽

pp. 123-130 ◽

Cited By ~ 12

Author(s):

Bin Chen ◽

Wei Sun

Keyword(s):

Electron Microscopy ◽

Dark Field ◽

Atomic Resolution ◽

High Angle ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Metastable Beta

Structural study of an Al73Ni22Fe5 decagonal quasicrystal by high-angle annular dark-field scanning transmission electron microscopy

Microscopy ◽

10.1093/jmicro/50.3.197 ◽

2001 ◽

Vol 50 (3) ◽

pp. 197-203 ◽

Cited By ~ 5

Author(s):

K. Saitoh ◽

M. Tanaka ◽

P. Tsai

Keyword(s):

Electron Microscopy ◽

Structural Study ◽

Dark Field ◽

High Angle ◽

Decagonal Quasicrystal ◽

Transmission Electron ◽

Scanning Transmission ◽

Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM)

2012 IEEE Statistical Signal Processing Workshop (SSP) ◽

10.1109/ssp.2012.6319793 ◽

2012 ◽

Cited By ~ 4

Author(s):

Singanallur Venkatakrishnan ◽

Lawrence Drummy ◽

Michael Jackson ◽

Marc De Graef ◽

Jeff Simmons ◽

...

Keyword(s):

Electron Microscopy ◽

Tomographic Reconstruction ◽

Dark Field ◽

High Angle ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Direct Observation of Atomic Ordering and Interface Structure in Co2MnSi/MgO/Co2MnSi Magnetic Tunnel Junctions by High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy

Applied Physics Express ◽

10.1143/apex.2.093001 ◽

2009 ◽

Vol 2 (9) ◽

pp. 093001 ◽

Cited By ~ 16

Author(s):

Toyoo Miyajima ◽

Mikihiko Oogane ◽

Yasutoshi Kotaka ◽

Takashi Yamazaki ◽

Mineharu Tsukada ◽

...

Keyword(s):

Electron Microscopy ◽

Tunnel Junctions ◽

Interface Structure ◽

Dark Field ◽

High Angle ◽

Transmission Electron ◽

Scanning Transmission ◽

Imaging of high-angle annular dark-field scanning transmission electron microscopy and observations of GaN-based violet laser diodes

Journal of Microscopy ◽

10.1111/j.1365-2818.2006.01613.x ◽

2006 ◽

Vol 223 (3) ◽

pp. 172-178 ◽

Cited By ~ 19

Author(s):

M. SHIOJIRI ◽

H. SAIJO

Keyword(s):

Electron Microscopy ◽

Laser Diodes ◽

Dark Field ◽

High Angle ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images

Ultramicroscopy ◽

10.1016/j.ultramic.2013.03.018 ◽

2013 ◽

Vol 131 ◽

pp. 1-9 ◽

Cited By ~ 14

Author(s):

Thorsten Mehrtens ◽

Knut Müller ◽

Marco Schowalter ◽

Dongzhi Hu ◽

Daniel M. Schaadt ◽

...

Keyword(s):

Electron Microscopy ◽

Dark Field ◽

Concentration Profiles ◽

High Angle ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Microscopy Images

Comparison of Interface Characterization between Ag(In,Ga)Se$_{2}$ and Cu(In,Ga)Se$_{2}$ Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.126603 ◽

2011 ◽

Vol 50 ◽

pp. 126603 ◽

Cited By ~ 1

Author(s):

Zhang Xianfeng ◽

Tsuyoshi Kobayashi ◽

Yasuyoshi Kurokawa ◽

Yoshiyuki Tashiro ◽

Masahiro Ohtsuka ◽

...

Keyword(s):

Electron Microscopy ◽

Solar Cells ◽

Dark Field ◽

High Angle ◽

Interface Characterization ◽

Transmission Electron ◽

Scanning Transmission ◽

Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures

Applied Physics Letters ◽

10.1063/1.2998656 ◽

2008 ◽

Vol 93 (15) ◽

pp. 153107 ◽

Cited By ~ 38

Author(s):

J. Pizarro ◽

P. L. Galindo ◽

E. Guerrero ◽

A. Yáñez ◽

M. P. Guerrero ◽

...

Keyword(s):

Electron Microscopy ◽

Dark Field ◽

High Angle ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Microscopy Images

High-angle annular dark-field scanning transmission electron microscopy and electron energy-loss spectroscopy of nano-granular Co–Al–O alloys

Scripta Materialia ◽

10.1016/s1359-6462(02)00626-7 ◽

2003 ◽

Vol 48 (7) ◽

pp. 909-914 ◽

Cited By ~ 5

Author(s):

N. Tanaka ◽

J. Yamasaki ◽

S. Mitani ◽

K. Takanashi

Keyword(s):

Electron Microscopy ◽

Energy Loss ◽

Dark Field ◽

High Angle ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Electron Energy Loss