Review of infrared spectroscopy techniques for the determination of internal structure in thin SiO2 films
2020 ◽
2013 ◽
Vol 41
(12)
◽
pp. 1928
Keyword(s):
1972 ◽
Vol 37
(6)
◽
pp. 1990-1992
◽
1970 ◽
Vol 35
(5)
◽
pp. 1587-1590
Keyword(s):
2021 ◽
Vol 667
(1)
◽
pp. 012003
Keyword(s):
2021 ◽
Vol 251
◽
pp. 119426