From Images to Interactions: High-Resolution Phase Imaging in Tapping-Mode Atomic Force Microscopy

Biophysical Journal ◽

10.1016/s0006-3495(01)76266-2 ◽

2001 ◽

Vol 80 (6) ◽

pp. 3009-3018 ◽

Author(s):

Martin Stark ◽

Clemens Möller ◽

Daniel J. Müller ◽

Reinhard Guckenberger

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Phase Imaging ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy

Biophysical Journal ◽

10.1016/s0006-3495(94)80649-6 ◽

1994 ◽

Vol 67 (4) ◽

pp. 1749-1753 ◽

Author(s):

C.A. Putman ◽

K.O. van der Werf ◽

B.G. de Grooth ◽

N.F. van Hulst ◽

J. Greve

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Living Cells ◽

High Resolution Imaging ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging ◽

Mode Atomic Force Microscopy

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High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/19/44/445717 ◽

2008 ◽

Vol 19 (44) ◽

pp. 445717 ◽

Author(s):

Ozgur Sahin ◽

Natalia Erina

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Dynamic Range ◽

Large Dynamic Range ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Application of phase-imaging tapping-mode atomic-force microscopy to investigate the grain growth and surface morphology of TiSi[sub 2]

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1501580 ◽

2002 ◽

Vol 20 (5) ◽

pp. 1866 ◽

Author(s):

C. H. Pang ◽

P. Hing ◽

A. See

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Grain Growth ◽

Phase Imaging ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Two-dimensional dopant profiling of patterned Si wafers using phase imaging tapping mode atomic force microscopy with applied biases

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.590760 ◽

1999 ◽

Vol 17 (4) ◽

pp. 1354 ◽

Author(s):

M. W. Nelson ◽

P. G. Schroeder ◽

R. Schlaf ◽

B. A. Parkinson

Keyword(s):

Atomic Force Microscopy ◽

Phase Imaging ◽

Two Dimensional ◽

Tapping Mode ◽

Dopant Profiling ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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High-Resolution Imaging of Antibodies by Tapping-Mode Atomic Force Microscopy: Attractive and Repulsive Tip-Sample Interaction Regimes

Biophysical Journal ◽

10.1016/s0006-3495(00)76712-9 ◽

2000 ◽

Vol 78 (3) ◽

pp. 1599-1605 ◽

Author(s):

Alvaro San Paulo ◽

Ricardo García

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

High Resolution Imaging ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging ◽

Mode Atomic Force Microscopy

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True molecular resolution in tapping-mode atomic force microscopy with high-resolution probes

Applied Physics Letters ◽

10.1063/1.1697629 ◽

2004 ◽

Vol 84 (14) ◽

pp. 2697-2699 ◽

Author(s):

Dmitry Klinov ◽

Sergei Magonov

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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The role of damping in phase imaging in tapping mode atomic force microscopy

Surface Science ◽

10.1016/s0039-6028(99)00368-4 ◽

1999 ◽

Vol 429 (1-3) ◽

pp. 178-185 ◽

Author(s):

Lugen Wang

Keyword(s):

Atomic Force Microscopy ◽

Phase Imaging ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Description of phase imaging in tapping mode atomic force microscopy by harmonic approximation

Surface Science ◽

10.1016/s0039-6028(98)00349-5 ◽

1998 ◽

Vol 411 (1-2) ◽

pp. L794-L801 ◽

Author(s):

Myung-Hwan Whangbo ◽

Georg Bar ◽

Rainer Brandsch

Keyword(s):

Atomic Force Microscopy ◽

Harmonic Approximation ◽

Phase Imaging ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Correlation between frequency-sweep hysteresis and phase imaging instability in tapping mode atomic force microscopy

Surface Science ◽

10.1016/s0039-6028(99)00702-5 ◽

1999 ◽

Vol 436 (1-3) ◽

pp. L715-L723 ◽

Author(s):

Georg Bar ◽

Rainer Brandsch ◽

Myung-Hwan Whangbo

Keyword(s):

Atomic Force Microscopy ◽

Phase Imaging ◽

Frequency Sweep ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Two-Dimensional Dopant Profiling of an Integrated Circuit Using Bias-Applied Phase-Imaging Tapping Mode Atomic Force Microscopy

Electrochemical and Solid-State Letters ◽

10.1149/1.1390875 ◽

1999 ◽

Vol 2 (9) ◽

pp. 475 ◽

Author(s):

M. W. Nelson

Keyword(s):

Atomic Force Microscopy ◽

Integrated Circuit ◽

Phase Imaging ◽

Two Dimensional ◽

Tapping Mode ◽

Dopant Profiling ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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