Study of defects and interfaces in epitaxial ZnO films on (112̄0) Al2O3 grown by electron cyclotron resonance-assisted molecular beam epitaxy

2001 ◽  
Vol 225 (2-4) ◽  
pp. 202-207 ◽  
Author(s):  
S.-H. Lim ◽  
D. Shindo ◽  
H.-B. Kang ◽  
K. Nakamura
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