High resolution transmission electron microscopy study of Se+‐implanted and annealed GaAs: Mechanisms of amorphization and recrystallization

High Resolution ◽

Microscopy Study ◽

High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Cited By ~ 3

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

High-resolution transmission electron microscopy study of ordered or disordered arrangements of Cu, C and N in the charge-reservoir blocks of a series of high-Tc superconductors: (Cu, C, N)Sr2Can-1CunOy (n = 1–6)

Philosophical Magazine B ◽

10.1080/13642810110079682 ◽

2001 ◽

Vol 81 (11) ◽

pp. 1847-1860

Author(s):

Yoshihiro Anan ◽

Toru Asaka ◽

Eiji Takayama-Muromachi ◽

Koji Kimoto ◽

Yoshio Matsui

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

High Tc Superconductors ◽

High Tc ◽

Transmission Electron ◽

C And N

High resolution transmission electron microscopy study on the nano-scale twinning of θ-NiMn precipitates in an Fe-Ni-Mn maraging alloy

physica status solidi (a) ◽

10.1002/pssa.200566023 ◽

2006 ◽

Vol 203 (9) ◽

pp. 2229-2235 ◽

Cited By ~ 15

Author(s):

S. Hossein Nedjad ◽

M. Nili Ahmadabadi ◽

T. Furuhara ◽

T. Maki

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Nano Scale ◽

High-resolution transmission electron microscopy study of a cross-linked fullerene-related multilayer graphitic material

Philosophical Magazine A ◽

10.1080/01418619908210353 ◽

1999 ◽

Vol 79 (5) ◽

pp. 1155-1166 ◽

Cited By ~ 6

Author(s):

L. N. Bourgeois ◽

L. A. Bursill

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Transmission Electron ◽

Graphitic Material

High resolution transmission electron microscopy study of interfaces

Materials Chemistry and Physics ◽

10.1016/0254-0584(92)90251-3 ◽

1992 ◽

Vol 32 (1) ◽

pp. 77-85 ◽

Cited By ~ 2

Author(s):

Joel Douin ◽

Thierry Epicier ◽

Jean-Michel Penisson ◽

Alain Thorel

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

High-resolution transmission electron microscopy study of chemically deposited cadmium sulphide thin films from aqueous ammonia solutions

Philosophical Magazine B ◽

10.1080/01418639308226399 ◽

1993 ◽

Vol 68 (2) ◽

pp. 185-194 ◽

Cited By ~ 36

Author(s):

Daniel Lincot ◽

RaÚL Ortega-Borges ◽

Michel Froment

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

High Resolution ◽

Aqueous Ammonia ◽

Cadmium Sulphide ◽

Microscopy Study ◽

A high resolution transmission electron microscopy study of SiC-coated graphite fiber-aluminum composite

Materials Science and Engineering A ◽

10.1016/0921-5093(89)90101-9 ◽

1989 ◽

Vol 117 ◽

pp. 199-206 ◽

Cited By ~ 9

Author(s):

Q. Li ◽

J. Megusar ◽

L.J. Masur ◽

J.A. Cornie

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Graphite Fiber ◽

Aluminum Composite ◽

High resolution transmission electron microscopy study on the development of nanostructured precipitates in Al–Cu obtained by mechanical alloying

Materials Chemistry and Physics ◽

10.1016/j.matchemphys.2011.11.007 ◽

2012 ◽

Vol 132 (1) ◽

pp. 125-130 ◽

Cited By ~ 7

Author(s):

L.S. Gomez-Villalba ◽

M.L. Delgado ◽

E.M. Ruiz-Navas

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Mechanical Alloying ◽

Microscopy Study ◽

Oxidation products of the niobium tungsten oxide Nb4W13O47: A high-resolution scanning transmission electron microscopy study

Journal of Solid State Chemistry ◽

10.1016/j.jssc.2006.02.020 ◽

2006 ◽

Vol 179 (6) ◽

pp. 1857-1863 ◽

Cited By ~ 8

Author(s):

Frank Krumeich ◽

Reinhard Nesper

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Oxidation Products ◽

Transmission Electron ◽

Scanning Transmission

High-resolution transmission electron microscopy study of interface structure and strain in epitaxial β-FeSi2 on Si (111) substrate

Journal of Crystal Growth ◽

10.1016/s0022-0248(03)01240-5 ◽

2003 ◽

Vol 255 (1-2) ◽

pp. 93-101 ◽

Cited By ~ 19

Author(s):

Ming Han ◽

Miyoko Tanaka ◽

Masaki Takeguchi ◽

Qi Zhang ◽

Kazuo Furuya

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Interface Structure ◽