Eddy current monitoring system and data reduction protocol for Czochralski silicon crystal growth
1988 ◽
Vol 88
(1)
◽
pp. 30-38
◽
Keyword(s):
Eddy current measurement of crystal axial thermal profiles during Czochralski silicon crystal growth
1988 ◽
Vol 88
(1)
◽
pp. 39-52
◽
Keyword(s):
2014 ◽
Vol 401
◽
pp. 888-894
◽
Keyword(s):
2013 ◽
Vol 371
◽
pp. 60-69
◽
Keyword(s):
2001 ◽
Vol 229
(1-4)
◽
pp. 6-10
◽
2004 ◽
Vol 21
(6)
◽
pp. 1231-1234
◽
Keyword(s):
2011 ◽
Vol 318
(1)
◽
pp. 178-182
◽
2017 ◽
Vol 170
◽
pp. 012020
Keyword(s):
1990 ◽
Vol 104
(2)
◽
pp. 327-344
◽
Keyword(s):