Trends in digital magnetic recording; the application of thin-film heads for tape recording

1998 ◽  
Vol 51 (1) ◽  
pp. 5-19 ◽  
Author(s):  
S.B. Luitjens ◽  
W. Folkerts ◽  
H.W. Van Kesteren ◽  
J.J.M. Ruigrok
Author(s):  
K. Ogura ◽  
H. Nishioka ◽  
N. Ikeo ◽  
T. Kanazawa ◽  
J. Teshima

Structural appraisal of thin film magnetic media is very important because their magnetic characters such as magnetic hysteresis and recording behaviors are drastically altered by the grain structure of the film. However, in general, the surface of thin film magnetic media of magnetic recording disk which is process completed is protected by several-nm thick sputtered carbon. Therefore, high-resolution observation of a cross-sectional plane of a disk is strongly required to see the fine structure of the thin film magnetic media. Additionally, observation of the top protection film is also very important in this field.Recently, several different process-completed magnetic disks were examined with a UHR-SEM, the JEOL JSM 890, which consisted of a field emission gun and a high-performance immerse lens. The disks were cut into approximately 10-mm squares, the bottom of these pieces were carved into more than half of the total thickness of the disks, and they were bent. There were many cracks on the bent disks. When these disks were observed with the UHR-SEM, it was very difficult to observe the fine structure of thin film magnetic media which appeared on the cracks, because of a very heavy contamination on the observing area.


1987 ◽  
Vol 23 (5) ◽  
pp. 3645-3647 ◽  
Author(s):  
V. Novotny ◽  
G. Itnyre ◽  
A. Homola ◽  
L. Franco

2014 ◽  
Vol 116 (3) ◽  
pp. 1257-1260 ◽  
Author(s):  
L. Zhang ◽  
S.-X. Xue ◽  
Z.-G. Li ◽  
Y.-P. Liu ◽  
W.-P. Chen

1989 ◽  
Vol 13 (S_1_PMRC_89) ◽  
pp. S1_773-777 ◽  
Author(s):  
Takashi TOMIE ◽  
Ikuto SUGIYAMA ◽  
Kimio KINOSHITA ◽  
Hisashi HAMANO ◽  
Isuke OUCHI

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