High-resolution scanning electron microscopy of thin-film magnetic media of magnetic recording disk

1992 ◽  
Vol 50 (2) ◽  
pp. 1334-1335
Author(s):  
K. Ogura ◽  
H. Nishioka ◽  
N. Ikeo ◽  
T. Kanazawa ◽  
J. Teshima
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
High Resolution ◽  
Magnetic Recording ◽  
High Performance ◽  
Magnetic Hysteresis ◽  
Grain Structure ◽  
Magnetic Media ◽  
Cross Sectional ◽  
Resolution Observation

Structural appraisal of thin film magnetic media is very important because their magnetic characters such as magnetic hysteresis and recording behaviors are drastically altered by the grain structure of the film. However, in general, the surface of thin film magnetic media of magnetic recording disk which is process completed is protected by several-nm thick sputtered carbon. Therefore, high-resolution observation of a cross-sectional plane of a disk is strongly required to see the fine structure of the thin film magnetic media. Additionally, observation of the top protection film is also very important in this field.Recently, several different process-completed magnetic disks were examined with a UHR-SEM, the JEOL JSM 890, which consisted of a field emission gun and a high-performance immerse lens. The disks were cut into approximately 10-mm squares, the bottom of these pieces were carved into more than half of the total thickness of the disks, and they were bent. There were many cracks on the bent disks. When these disks were observed with the UHR-SEM, it was very difficult to observe the fine structure of thin film magnetic media which appeared on the cracks, because of a very heavy contamination on the observing area.

Polymer mask-weakening grain-boundary effect: towards high-performance organic thin-film transistors with mobility closing to 20 cm2 V−1 s−1

2020 ◽  
Vol 4 (10) ◽  
pp. 2990-2994
Author(s):  
Deyang Ji ◽  
Jie Li ◽  
Xiaosong Chen ◽  
Lin Li ◽  
Liqiang Li ◽  
...  
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Grain Boundary ◽  
Thin Film Transistors ◽  
High Performance ◽  
Boundary Effect ◽  
Organic Thin Film Transistors ◽  
Organic Thin Film ◽  
Top Contact ◽  
Grain Boundary Effect

Polystyrene-based masks are fabricated to produce top-contact high-resolution (5 μm) electrodes. With this mask, the mobility of DPA-based thin-film transistors could reach 19.22 cm2 V−1 s−1, which is a new breakthrough for DPA thin-film transistors.

Study of the growth mechanism of highly in-plane aligned α-axis YBa2Cu3O7−x thin films on LaSrGaO4 substrate by high resolution electron microscopy

1996 ◽  
Vol 11 (12) ◽  
pp. 2951-2954 ◽  
Author(s):  
J. G. Wen ◽  
S. Mahajan ◽  
H. Ohtsuka ◽  
T. Morishita ◽  
N. Koshizuka
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Cross Sectional ◽  
Plan View ◽  
Oriented Film ◽  
Resolution Electron ◽  
Average Size

Highly in-plane aligned α-axis YBa2Cu3O7−x thin films deposited on (100) LaSrGaO4 substrates by a self-template method were studied by high-resolution electron microscopy along three orthogonal 〈100〉 axes of the substrate. Plan-view images confirm that the majority of the film preferentially aligns across the entire substrate except for very few misaligned domains with average size 10 nm2. Cross-sectional images along the [100] orientation of YBa2Cu3O7−x reveal that in-plane aligned α-axis YBa2Cu3O7−x is grown on a template layer dominated by c-axis oriented film. This strongly suggests that the in-plane alignment of α-axis YBa2Cu3O7−x thin films on (100) LaSrGaO4 substrates is governed by the different stresses along the b and c axes of the substrate. Cross-sectional images along [001] of the YBa2Cu3O7—x thin film reveal that the 90° domains easily nucleate in the region between α-axis YBa2Cu3O7—x and the YBa4Cu3Ox phase. Cracks along the (001) plane of YBa2Cu3O7−x are found to be due to the large mismatch between the c parameters of the thin film and substrate.

Transmission electron microscopy and high resolution scanning electron microscopy of Co-Ni-Pt thin film magnetic recording media

1989 ◽  
Vol 47 ◽  
pp. 570-571
Author(s):  
L. Chan ◽  
T. Yamashita ◽  
R. Sinclair
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Hysteresis ◽  
Exchange Interactions ◽  
Magnetic Media ◽  
Transmission Electron ◽  
Hysteresis Properties ◽  
Scanning Electron

In thin film magnetic media, the magnetic hysteresis properties and micromagnetic domain behavior are strongly influenced by both interparticle exchange interactions and by magnetostatic interactions. The exchange interactions are short-range in nature; therefore, they are very sensitive to interparticle separation. Consequently, the magnetic hysteresis properties and the recording behavior of the thin film magnetic media can be drastically altered by the introduction of grain separation during the film deposition process. In this study, thin film media of a CoNiPt alloy of one composition was processed under two different conditions. Transmission electron microscopy (TEM) and high resolution scanning electron microscopy (HRSEM) were used to investigate and explain the difference in magnetic hysteresis characteristics of the films.The structure of the thin film media consisted of a 600 Å thick CoNiPt alloy sputtered on textured 130mm diameter NiP-plated aluminum substrates. A single sputtering parameter was varied to produce two types of films, labelled type I and type II, which exhibited significant differences in their magnetic recording characteristics.

High Performance Dual Gate Blue Laser Annealed Poly-Si Thin-Film Transistor for High-Resolution Displays

2021 ◽  
pp. 1-7
Author(s):  
Duk Young Jeong ◽  
Mohammad Masum Billah ◽  
Abu Bakar Siddik ◽  
Byungju Han ◽  
Yeoungjin Chang ◽  
...  
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
High Performance ◽  
Thin Film Transistor ◽  
Blue Laser ◽  
Dual Gate ◽  
Si Thin Film

MHz-Range Fully Printed High-Performance Thin-Film Transistors by Using High-Resolution Gravure-Printed Lines

2015 ◽  
Vol 1 (12) ◽  
pp. 1500155 ◽  
Author(s):  
Rungrot Kitsomboonloha ◽  
Hongki Kang ◽  
Gerd Grau ◽  
William Scheideler ◽  
Vivek Subramanian
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Thin Film Transistors ◽  
High Performance

Development of high-performance magnetic thin film for high-density magnetic recording

2005 ◽  
Vol 50 (23) ◽  
pp. 4576-4585 ◽  
Author(s):  
Tetsuya Osaka ◽  
Toru Asahi ◽  
Jun Kawaji ◽  
Tokihiko Yokoshima
Keyword(s):  
Thin Film ◽  
Magnetic Recording ◽  
High Performance ◽  
High Density ◽  
Magnetic Thin Film ◽  
High Density Magnetic Recording

Fabrication of a high-performance thin film polarizer using lyotropic chromonic liquid crystals using a high-resolution nanoscale template

2017 ◽  
Vol 5 (46) ◽  
pp. 12241-12248 ◽  
Author(s):  
Hyuk Jun Kim ◽  
Woo-Bin Jung ◽  
Hyeon Su Jeong ◽  
Hee-Tae Jung
Keyword(s):  
Thin Film ◽  
Liquid Crystals ◽  
High Resolution ◽  
High Performance ◽  
Potential Applications

Lyotropic chromonic liquid crystals (LCLCs) have attracted attention for their potential applications as thin-film polarizers.

Liquid thin film dewetting-driven micropatterning of reduced graphene oxide electrodes for high performance OFETs

2019 ◽  
Vol 7 (1) ◽  
pp. 153-160 ◽  
Author(s):  
Sung Min Lee ◽  
Seung Keun Song ◽  
Seongwon Yoon ◽  
Dae Sung Chung ◽  
Suk Tai Chang
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Graphene Oxide ◽  
High Resolution ◽  
Reduced Graphene Oxide ◽  
High Performance ◽  
Oxide Electrodes ◽  
Reduced Graphene ◽  
Liquid Thin Films

High resolution micropatterning of rGO electrodes based on the dewetting of liquid thin films is presented.

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