FIBSIM – dynamic Monte Carlo simulation of compositional and topography changes caused by focused ion beam milling

2001 ◽  
Vol 180 (1-4) ◽  
pp. 125-129 ◽  
Author(s):  
W. Boxleitner ◽  
G. Hobler
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Dynamic Monte Carlo ◽  
Focused Ion Beam Milling

scholarly journals Monte Carlo simulation of nanoscale material focused ion beam gas-assisted etching: Ga+ and Ne+ etching of SiO2 in the presence of a XeF2 precursor gas

2019 ◽  
Vol 1 (9) ◽  
pp. 3584-3596 ◽  
Author(s):  
Kyle T. Mahady ◽  
Shida Tan ◽  
Yuval Greenzweig ◽  
Amir Raveh ◽  
Philip D. Rack
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Successful Development ◽  
Nanoscale Material ◽  
Ion Beam Etching

Successful development of a Monte Carlo simulation that accurately emulates gas assisted nanoscale focused ion beam etching.

Dynamic Monte Carlo Simulation of thel,l-Lactide Ring-Opening Polymerization

2016 ◽  
Vol 11 (1) ◽  
pp. 1600039 ◽  
Author(s):  
Dimitrios Meimaroglou ◽  
Prokopios Pladis ◽  
Costas Kiparissides
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Ring Opening ◽  
Ring Opening Polymerization ◽  
Dynamic Monte Carlo

scholarly journals A streamlined workflow for automated cryo focused ion beam milling

2021 ◽  
pp. 107743
Author(s):  
Sebastian Tacke ◽  
Philipp Erdmann ◽  
Zhexin Wang ◽  
Sven Klumpe ◽  
Michael Grange ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling
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