Annealing effects on field emission properties of tetrahedral amorphous carbon films

2001 ◽  
Vol 174 (3-4) ◽  
pp. 283-288 ◽  
Author(s):  
Y.J Li ◽  
S.P Lau ◽  
B.K Tay ◽  
Z Sun ◽  
G.Y Chen ◽  
...  
2013 ◽  
Vol 2013 ◽  
pp. 1-11 ◽  
Author(s):  
R. K. Tripathi ◽  
O. S. Panwar ◽  
A. K. Srivastava ◽  
Ishpal ◽  
Mahesh Kumar ◽  
...  

This paper reports the effect of substrate bias on the structural, nanomechanical, and field emission properties of amorphous carbon films having embedded nanocrystallites (a-C:nc films) deposited by filtered anodic jet carbon arc technique. X-ray diffraction results exhibit predominantly an amorphous nature of the films. High-resolution transmission electron microscope images showed the amorphous nature of the films with nanocrystallites embedded in the amorphous matrix. Ultrafine nanograined microstructures with average grain size between 20 and 30 nm are observed throughout the film with a majority of the grains of single crystallites. A strong influence of substrate bias has been observed on the structural, nanomechanical, and field emission properties. Maximum nanohardness (H) of 58.3 GPa, elastic modulus (E) of 426.2 GPa, and H/E of 0.136 have been observed in a-C:nc films deposited at −60 V substrate bias which showed 82.6% sp3 content.


2011 ◽  
Vol 32 (1) ◽  
pp. 83-86
Author(s):  
张新月 ZHANG Xin-yue ◽  
曾凡光 ZENG Fan-guang ◽  
姚宁 YAO Ning ◽  
张兵临 ZHANG Bing-lin

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