Characterization of surface nanostructures by STM light emission spectroscopy

1997 ◽  
Vol 113-114 ◽  
pp. 335-342 ◽  
Author(s):  
S. Ushioda
Hyomen Kagaku ◽  
1995 ◽  
Vol 16 (5) ◽  
pp. 286-290
Author(s):  
Yoichi UEHARA ◽  
Sukekatsu USHIODA

1999 ◽  
Vol 588 ◽  
Author(s):  
S. Ushioda

AbstractVisible light is emitted when electrons (holes) are injected into a sample from the tip of the scanning tunneling microscope (STM). By analyzing the spectra of the emitted light, one can not only determine the surface geometry by usual STM imaging, but also learn the electronic and optical properties of specific individual nanostructures. This technique has been applied to investigate the electronic transitions of individual protrusions of porous Si and semiconductor quantum wells of AlGaAs/GaAs. The usefulness, limitations, and future expectations of this novel technique are discussed.


Hyomen Kagaku ◽  
2008 ◽  
Vol 29 (1) ◽  
pp. 50-54
Author(s):  
Hiroshi IWASAKI ◽  
Hongwen LIU ◽  
Ryusuke NISHITANI

1995 ◽  
Vol 324 (2-3) ◽  
pp. 282-288 ◽  
Author(s):  
K. Ito ◽  
S. Ohyama ◽  
Y. Uehara ◽  
S. Ushioda

1992 ◽  
Vol 60-61 ◽  
pp. 448-453 ◽  
Author(s):  
S. Ushioda ◽  
Y. Uehara ◽  
M. Kuwahara

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