Optical Characterization of Individual Nanostructures by STM Light Emission

1999 ◽  
Vol 588 ◽  
Author(s):  
S. Ushioda
Keyword(s):  
Quantum Wells ◽  
Scanning Tunneling Microscope ◽  
Light Emission ◽  
Electronic Transitions ◽  
Scanning Tunneling ◽  
Surface Geometry ◽  
Future Expectations ◽  
Semiconductor Quantum Wells ◽  
Stm Light Emission

AbstractVisible light is emitted when electrons (holes) are injected into a sample from the tip of the scanning tunneling microscope (STM). By analyzing the spectra of the emitted light, one can not only determine the surface geometry by usual STM imaging, but also learn the electronic and optical properties of specific individual nanostructures. This technique has been applied to investigate the electronic transitions of individual protrusions of porous Si and semiconductor quantum wells of AlGaAs/GaAs. The usefulness, limitations, and future expectations of this novel technique are discussed.

STM-Light Emission From Metal Deposited Semiconductor Surfaces

1999 ◽  
Vol 588 ◽  
Author(s):  
N. Yamamoto ◽  
S. Kagami ◽  
H. Minoda
Keyword(s):  
Scanning Tunneling Microscope ◽  
High Spatial Resolution ◽  
Light Emission ◽  
Detection System ◽  
Single Atom ◽  
Scanning Tunneling ◽  
Nanometer Scale ◽  
Silver Films ◽  
Residual Gas ◽  
Stm Light Emission

AbstractLight detection system combined with a UHV-scanning tunneling microscope (STM) was applied to the study of silver films deposited on Si(111) surfaces. Photon maps clearly show single atom height steps and terraces on an Ag(111) surface with high spatial resolution of nanometer scale. Chemical reaction on the Ag surface with residual gas was clearly revealed in the photon map. In the photon map of the thin Ag film of 2˜3 ML in thick, no contrast appears between the terraces, and a characteristic bright contrast appears at the single atom height steps. The local plasmon model does not readily explain those contrasts.

Molecular spectroscopy of dye aggregates by scanning-tunneling-microscope-induced light emission

2001 ◽  
Vol 79 (4) ◽  
pp. 527-529 ◽  
Author(s):  
F. Touhari ◽  
E. J. A. J. Stoffels ◽  
J. W. Gerritsen ◽  
H. van Kempen ◽  
P. Callant
Keyword(s):  
Scanning Tunneling Microscope ◽  
Light Emission ◽  
Molecular Spectroscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscope
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