High-resolution electron energy loss spectroscopy evidence for electron beam-induced decomposition of trimethylsilane adsorbed on Si(100)

J Lozano; J.H Campbell; J.H Craig

doi:10.1016/s0169-4332(98)00338-9

High-resolution electron energy loss spectroscopy evidence for electron beam-induced decomposition of trimethylsilane adsorbed on Si(100)

Applied Surface Science ◽

10.1016/s0169-4332(98)00338-9 ◽

1998 ◽

Vol 136 (1-2) ◽

pp. 159-165 ◽

Cited By ~ 15

Author(s):

J Lozano ◽

J.H Campbell ◽

J.H Craig

Keyword(s):

Electron Beam ◽

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Resolution Electron ◽

Induced Decomposition ◽

Electron Energy Loss

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Momentum- and space-resolved high-resolution electron energy loss spectroscopy of individual single-wall carbon nanotubes

Physical Review B ◽

10.1103/physrevb.95.195411 ◽

2017 ◽

Vol 95 (19) ◽

Cited By ~ 9

Author(s):

F. S. Hage ◽

T. P. Hardcastle ◽

A. J. Scott ◽

R. Brydson ◽

Q. M. Ramasse

Keyword(s):

Carbon Nanotubes ◽

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Single Wall Carbon Nanotubes ◽

Single Wall Carbon ◽

Resolution Electron ◽

Electron Energy Loss

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Adsorption of Fluorinated C60on the Si(111)-(7×7) Surface Studied by Scanning Tunneling Microscopy and High-Resolution Electron Energy Loss Spectroscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.41.245 ◽

2002 ◽

Vol 41 (Part 1, No. 1) ◽

pp. 245-249 ◽

Cited By ~ 9

Author(s):

Yasunori Fujikawa ◽

Jerzy T. Sadowski ◽

Kevin F. Kelly ◽

Koji S. Nakayama ◽

Edward T. Mickelson ◽

...

Keyword(s):

High Resolution ◽

Energy Loss ◽

Scanning Tunneling Microscopy ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Resolution Electron ◽

Electron Energy Loss

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Investigation of the space charge regime of epitaxially grown GaAs (100) by high-resolution electron energy-loss spectroscopy

Applied Surface Science ◽

10.1016/s0169-4332(96)00116-x ◽

1996 ◽

Vol 104-105 ◽

pp. 24-34 ◽

Cited By ~ 3

Author(s):

V.M. Polyakov ◽

A. Elbe ◽

J. Wu ◽

G.J. Lapeyre ◽

J.A. Schaefer

Keyword(s):

High Resolution ◽

Energy Loss ◽

Space Charge ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Resolution Electron ◽

Electron Energy Loss

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ChemInform Abstract: Adsorption and Reaction of Formic Acid on NiO(100) Films on Mo(100): Temperature Programmed Desorption and High Resolution Electron Energy Loss Spectroscopy Studies.

ChemInform ◽

10.1002/chin.199317036 ◽

2010 ◽

Vol 24 (17) ◽

pp. no-no

Author(s):

C. M. TRUONG ◽

M.-C. WU ◽

D. W. GOODMAN

Keyword(s):

High Resolution ◽

Energy Loss ◽

Formic Acid ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Temperature Programmed Desorption ◽

Resolution Electron ◽

Temperature Programmed ◽

Spectroscopy Studies ◽

Electron Energy Loss

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A nanoscale investigation on the influence of anodization parameters during plasma electrolytic oxidation of titanium by high-resolution electron energy loss spectroscopy

Applied Surface Science ◽

10.1016/j.apsusc.2021.151133 ◽

2021 ◽

pp. 151133

Author(s):

Luca Casanova ◽

Mattia Arosio ◽

Mohammad Taghi Hashemi ◽

MariaPia Pedeferri ◽

Gianluigi A. Botton ◽

...

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Plasma Electrolytic Oxidation ◽

Resolution Electron ◽

Electrolytic Oxidation ◽

Plasma Electrolytic ◽

Electron Energy Loss

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Local bonding structures of SiO2 films on H-terminated Si(100) surfaces studied by using high-resolution electron energy loss spectroscopy

Applied Surface Science ◽

10.1016/s0169-4332(98)00049-x ◽

1998 ◽

Vol 130-132 ◽

pp. 192-196 ◽

Cited By ~ 7

Author(s):

Y. Nakagawa ◽

M. Higashi ◽

H. Ikeda ◽

S. Zaima ◽

Y. Yasuda

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Sio2 Films ◽

Resolution Electron ◽

Local Bonding ◽

Electron Energy Loss

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Application of high‐resolution electron energy loss spectroscopy to the adsorption and the photoreaction of CH2I2 and CD3OD on a MoOx thin film

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.579469 ◽

1995 ◽

Vol 13 (6) ◽

pp. 2689-2697 ◽

Cited By ~ 4

Author(s):

Hong He ◽

Junji Nakamura ◽

Naoki Takehiro ◽

Ken‐ichi Tanaka

Keyword(s):

Thin Film ◽

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Resolution Electron ◽

Electron Energy Loss

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Characterization of insulators by high-resolution electron-energy-loss spectroscopy: Application of a surface-potential stabilization technique

Physical Review B ◽

10.1103/physrevb.33.5682 ◽

1986 ◽

Vol 33 (8) ◽

pp. 5682-5697 ◽

Cited By ~ 95

Author(s):

M. Liehr ◽

P. A. Thiry ◽

J. J. Pireaux ◽

R. Caudano

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Surface Potential ◽

Electron Energy Loss Spectroscopy ◽

Resolution Electron ◽

Stabilization Technique ◽

Electron Energy Loss

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High-resolution electron-energy-loss spectroscopy studies of GaAs (100) surfaces

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.583738 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1113 ◽

Cited By ~ 119

Author(s):

D. J. Frankel

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Resolution Electron ◽

Spectroscopy Studies ◽

Electron Energy Loss

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High resolution electron energy loss spectroscopy study of Fomblin Z-tetraol thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1861052 ◽

2005 ◽

Vol 23 (2) ◽

pp. 316-321

Author(s):

Dougyong Sung ◽

Andrew J. Gellman ◽

Jing Gui ◽

Xiaoding Ma

Keyword(s):

Thin Films ◽

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Spectroscopy Study ◽

Resolution Electron ◽

Fomblin Z ◽

Electron Energy Loss

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