Effect of surface topographies of PTFE and polyimide as characterized by atomic force microscopy on the heterogeneous nucleation of isotactic polypropylene

1999 ◽  
Vol 58 (3) ◽  
pp. 268-275 ◽  
Author(s):  
C.W Lin ◽  
Y.C Du
Keyword(s):  
Atomic Force Microscopy ◽  
Isotactic Polypropylene ◽  
Heterogeneous Nucleation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Topographies ◽  
Effect Of Surface

Miscibility of isotactic poly(1-butene)/isotactic polypropylene blends studied by atomic force Microscopy−Infrared

Polymer ◽  
2021 ◽  
pp. 124445
Author(s):  
Jiugeng Cheng ◽  
Zhenxing Zhong ◽  
Yuan Lin ◽  
Zhaohui Su ◽  
Chunyu Zhang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Isotactic Polypropylene ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polypropylene Blends

Effect of surface modification on interfacial nanobubble morphology and contact line tension

Soft Matter ◽  
2015 ◽  
Vol 11 (26) ◽  
pp. 5214-5223 ◽  
Author(s):  
Kaushik K. Rangharajan ◽  
Kwang J. Kwak ◽  
A. T. Conlisk ◽  
Yan Wu ◽  
Shaurya Prakash
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
Contact Line ◽  
Line Tension ◽  
Surface Hydrophobicity ◽  
Saturation State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy ◽  
Effect Of Surface

Using tapping mode atomic force microscopy, changes to interfacial nanobubble morphology and associated characteristics are analyzed as a function of surface hydrophobicity and solvent–air saturation state.

Melting behavior of lamellae of isotactic polypropylene studied using hot-stage atomic force microscopy

2006 ◽  
Vol 285 (4) ◽  
pp. 449-455 ◽  
Author(s):  
Xi Wang ◽  
Weimin Hou ◽  
Jianjun Zhou ◽  
Lin Li ◽  
Yang Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Isotactic Polypropylene ◽  
Melting Behavior ◽  
Force Microscopy ◽  
Atomic Force

Effect of Surface Treatments in Nanocrystalline Silicon

2002 ◽  
Vol 737 ◽  
Author(s):  
N. P. Mandal ◽  
S. Dey ◽  
S. C. Agarwal
Keyword(s):  
Atomic Force Microscopy ◽  
Porous Silicon ◽  
Dark Current ◽  
Quantum Confinement ◽  
Nanocrystalline Silicon ◽  
Force Microscopy ◽  
Prepared Sample ◽  
Atomic Force ◽  
Treated Sample ◽  
Effect Of Surface

ABSTRACTExposure to ammonia (NH3) increases the dark current (DC) in porous silicon (PS), but evaporated selenium (Se) deposited on PS decreases DC. Photoluminescence (PL) measurement shows that there are two types of centers. PL in one region of PS (Peak ∼ 800nm) initially increases with the NH3 exposure and then decreases. But the PL from another region of PS has a peak at ∼ 780nm and it decreases continuously with the NH3 exposure. Dipping PS in water and drying in air shifts the PL peak at 800 nm to 744 nm. Atomic Force Microscopy (AFM) shows that the as prepared sample has wires of diameters 2.4nm, 3.4nm, 4.6nm and bigger. However, in the AFM images of the water treated sample the wires of diameters 3.4nm and 4.6nm are absent. The PL results are explained using the AFM data and the John-Singh model of quantum confinement.

Contact faces of epitaxially crystallized .alpha.- and .gamma.-phase isotactic polypropylene observed by atomic force microscopy

1993 ◽  
Vol 26 (22) ◽  
pp. 5915-5923 ◽  
Author(s):  
W. Stocker ◽  
S. N. Magonov ◽  
H. J. Cantow ◽  
J. C. Wittmann ◽  
B. Lotz
Keyword(s):  
Atomic Force Microscopy ◽  
Isotactic Polypropylene ◽  
Gamma Phase ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Effect of surface nanoscale topography on elastic modulus of individual osteoblastic cells as determined by atomic force microscopy

2007 ◽  
Vol 40 (13) ◽  
pp. 2865-2871 ◽  
Author(s):  
Joshua C. Hansen ◽  
Jung Yul Lim ◽  
Li-Chong Xu ◽  
Christopher A. Siedlecki ◽  
David T. Mauger ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Modulus ◽  
Osteoblastic Cells ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Topography ◽  
Effect Of Surface
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