Rapid determination of fractal structure of bacterial assemblages in wastewater treatment: Implications to process optimisation

A rapid method of determining the structure of aggregated particles using small angle laser light scattering is applied here to assemblages of bacteria from wastewater treatment systems. The structure information so obtained is suggestive of fractal behaviour as found by other methods. Strong dependencies are shown to exist between the fractal structure of the bacterial aggregates and the behaviour of the biosolids in zone settling and dewatering by both pressure filtration and centrifugation methods. More rapid settling and significantly higher solids contents are achievable for “looser” flocs characterised by lower fractal dimensions. The rapidity of determination of structural information and the strong dependencies of the effectiveness of a number of wastewater treatment processes on aggregate structure suggests that this method may be particularly useful as an on-line control tool.

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Rapid Determination of Bacterial Assemblage Structure: Implications to Process Optimisation in Wastewater Treatment

Chemical Water and Wastewater Treatment V ◽

10.1007/978-3-642-72279-0_22 ◽

1998 ◽

pp. 269-283 ◽

Cited By ~ 2

Author(s):

T. D. Waite ◽

Jing Guan ◽

Rose Amal

Keyword(s):

Wastewater Treatment ◽

Rapid Determination ◽

Assemblage Structure ◽

Process Optimisation ◽

Bacterial Assemblage

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Simple and efficient dual-wavelength spectroscopy for the determination of organic matter in sewage sludge from wastewater treatment

RSC Advances ◽

10.1039/c9ra00428a ◽

2019 ◽

Vol 9 (22) ◽

pp. 12580-12584

Author(s):

Xiaojie Tu ◽

Zhanbo Hu ◽

Xin-Sheng Chai ◽

Yuting Su

Keyword(s):

Organic Matter ◽

Wastewater Treatment ◽

Sewage Sludge ◽

Rapid Determination ◽

Spectroscopic Method ◽

Dual Wavelength

In this study, a dual-wavelength spectroscopic method for rapid determination of organic matter in sludge was developed.

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Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092918 ◽

1976 ◽

Vol 34 ◽

pp. 590-591

Author(s):

T. Y. Tan ◽

W. K. Tice

Keyword(s):

Fast Neutron ◽

Rapid Determination ◽

Stacking Faults ◽

Imaging Method ◽

Large Reduction ◽

Dislocation Loops ◽

Fringe Spacing ◽

Weak Beam ◽

Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

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